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| 型号： | ADUM1420BRWZ-RL |
| 厂商： | Analog Devices Inc |
| 文件页数： | 9/12页 |
| 文件大小： | 0K |
| 描述： | IC ISOLATOR DGTL 4CH 28SOIC |
| 产品变化通告： | ADuM1420 Obsolescence 09/Mar/2012 |
| 标准包装： | 1,000 |
| 系列： | iCoupler® |
| 输入 - 1 侧/2 侧： | 4/0 |
| 通道数： | 4 |
| 电源电压： | 4.5 V ~ 5.5 V |
| 电压 - 隔离： | 1667Vrms |
| 数据速率： | 10Mbps |
| 传输延迟： | 110ns |
| 输出类型： | 逻辑 |
| 封装/外壳： | 28-SOIC（0.295"，7.50mm 宽） |
| 供应商设备封装： | 28-SOIC W |
| 包装： | 带卷 (TR) |
| 工作温度： | -40°C ~ 105°C |
ADuM1420
APPLICATION INFORMATION
COMMON-MODE TRANSIENT IMMUNITY
In general, common-mode transients consist of linear and
sinusoidal components. The linear component of a common-
mode transient is given by
V CM, linear = (Δ V /Δ t ) t
where Δ V /Δ t is the slope of the transient shown in Figure 8 and
Figure 9.
The sinusoidal component (at a given frequency) is given by
V CM, sinusoidal = V 0 sin(2π ft )
where:
V 0 is the magnitude of the sinusoidal.
f is the frequency of the sinusoidal.
The transient magnitude of the sinusoidal component is given by
dV CM / dt = 2π f V 0
15V
V DD1
5V
The ability of the ADuM1420 to operate correctly in the
V DDA AND V DDB
GND A AND GND B
V DD1
GND 1
15V
5V
Δ V
Δ t
GND 1
V DDA AND V DDB
GND A AND GND B
15V
Δ V
Δ t
15V
presence of sinusoidal transients is characterized by the data in
Figure 11 and Figure 12. The data is based on design simulation
and is the maximum sinusoidal transient magnitude (2πf V 0 )
that the ADuM1420 can tolerate without an operational error.
Values for immunity against sinusoidal transients are not included
in Table 5 because measurements to obtain such values have not
Figure 8. Common-Mode Transient Immunity Waveforms, Input to Output
been possible.
300
15V
V DDA /V DDB
15V
GND A /GND B
V DDB /V DDA
15V
250
V DDA /V DDB
GND A /GND B
V DDB /V DDA
GND A /GND B
15V
15V
Δ V
Δ t
GND B /GND A
Δ V
Δ t
15V
200
150
B EST-CASE PROCESS VARIATION
Figure 9. Common-Mode Transient Immunity Waveforms Between Outputs
The transient of the linear component is given by
100
50
dV CM / dt = Δ V /Δ t
The ability of the ADuM1420 to operate correctly in the
0
0
250
500
WORST-CASE PROCESS VARIATION
750 1000 1250 1500 1750
2000
presence of linear transients is characterized by the data in
Figure 10. The data is based on design simulation and is the
maximum linear transient magnitude that the ADuM1420 can
tolerate without an operational error. This data shows a higher
level of robustness than what is shown in Table 5 because the
transient immunity values obtained in Table 5 use measured
data and apply allowances for measurement error and margin.
400
350
250
200
150
FREQUENCY (MHz)
Figure 11. Transient Immunity (Sinusoidal Transients),
27°C Ambient Temperature
BEST-CASE PROCESS VARIATION
300
250
200
BEST-CASE PROCESS VARIATION
100
50
150
0
0
250
WORST-CASE PROCESS VARIATION
500 750 1000 1250 1500
1750
2000
100
50
WORST-CASE PROCESS VARIATION
FREQUENCY (MHz)
Figure 12. Transient Immunity (Sinusoidal Transients),
100°C Ambient Temperature
0
–40
–20
0
20
40
60
80
100
TEMPERATURE (°C)
Figure 10. Transient Immunity (Linear Transients) vs. Temperature
Rev. A | Page 9 of 12
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