参数资料
型号: AGRA10XM
厂商: LSI CORP
元件分类: 功率晶体管
英文描述: UHF BAND, Si, N-CHANNEL, RF POWER, MOSFET
封装: GULL WING PACKAGE-8
文件页数: 1/8页
文件大小: 326K
代理商: AGRA10XM
Preliminary Data Sheet
August 2004
AGRA10XM
10 W, 100 MHz—1.0 GHz, N-Channel E-Mode, Lateral MOSFET
Introduction
The AGRA10 is a broadband general-purpose, high-
voltage, gold-metalized, laterally diffused metal oxide
semiconductor (LDMOS) RF power transistor suit-
able for Nordic Mobile Telephone (NMT) 460 MHz
to 472 MHz, personal cellular band IS-95 865 MHz to
895 MHz, global system for mobile communications/
enhanced data GSM environment (GSM/EDGE)
921 MHz to 960 MHz, and power supply switching
applications from 100 MHz to 1 GHz.
Figure 1. AGRA10 Gull Wing Package
Device Features
High-reliability, gold-metalization process.
Low hot carrier injection (HCI) induced bias drift
over 20 years.
High gain, efficiency, and linearity.
Integrated ESD protection.
Device can withstand a 10:1 voltage standing wave
ratio (VSWR) with 10 W CW output power.
Large signal impedance parameters available.
Performance Features
450 MHz to 500 MHz
Continuous wave (CW) performance @ 28 V:
— Output power:
10 W minimum @ P1dB
16 W typical @ P1dB.
— Power gain: 24 dB.
— Efficiency: 64% @ P1dB.
— Return loss: –10 dB.
865 MHz to 895 MHz
CW performance @ 28 V:
— Output power:
10 W minimum @ P1dB
11 W typical @ P1dB.
— Power gain: 22 dB.
— Efficiency: 65% @ P1dB.
— Return loss: –10 dB.
921 MHz to 960 MHz
CW performance @ 26 V:
— Output power:
10 W minimum @ P1dB
11 W typical @ P1dB.
— Power gain: 21 dB.
— Efficiency: 61% @ P1dB.
— Return loss: –10 dB.
Table 1. ESD Rating*
* Although electrostatic discharge (ESD) protection circuitry has
been designed into this device, proper precautions must be
taken to avoid exposure to ESD and electrical overstress (EOS)
during all handling, assembly, and test operations. Agere
employs a human-body model (HBM), a machine model (MM),
and a charged-device model (CDM) qualification requirement in
order to determine ESD-susceptibility limits and protection
design evaluation. ESD voltage thresholds are dependent on the
circuit parameters used in each of the models, as defined by
JEDEC's JESD22-A114B (HBM), JESD22-A115A (MM), and
JESD22-C101A (CDM) standards.
Caution: MOS devices are susceptible to damage from elec-
trostatic charge. Reasonable precautions in han-
dling and packaging MOS devices should be
observed.
AGRA10
Minimum (V)
Class
HBM
500
1B
MM
50
A
CDM
1500
4
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