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参数资料
| 型号： | AP2111SG-13 |
| 厂商： | Diodes Inc |
| 文件页数： | 2/14页 |
| 文件大小： | 0K |
| 描述： | IC USB SWITCH 2.45A CURRENT 8SOP |
| 标准包装： | 1 |
| 类型： | USB 开关 |
| 输出数： | 1 |
| Rds（开）： | 115 毫欧 |
| 内部开关： | 是 |
| 电流限制： | 2.45A |
| 输入电压： | 2.7 V ~ 5.5 V |
| 工作温度： | -35°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 8-SOIC（0.154"，3.90mm 宽） |
| 供应商设备封装： | 8-SOP |
| 包装： | 标准包装 |
| 产品目录页面： | 1136 (CN2011-ZH PDF) |
| 其它名称： | AP2111SG-13DIDKR |
AP2101/AP2111
Available Options
Part Number
AP2101
AP2111
Channel
1
1
Enable Pin
(EN)
Active Low
Active High
Current Limit
(Typical)
2.45A
2.45A
Recommended Maximum
Continuous Load Current
2.0A
2.0A
Pin Descriptions
Pin
Name
Pin Number
SO-8 MSOP-8EP
Functions
GND
IN
EN
FLG
OUT
NC
1
2, 3
4
5
6, 7
8
1
2, 3
4
5
6, 7
8
Ground
Voltage input pin (all IN pins must be tied together externally)
Enable input, active low (AP2101) or active high (AP2111)
Over-current and over-temperature fault report; open-drain flag is active low when triggered
Voltage output pin (all OUT pins must be tied together externally)
No internal connection; recommend tie to OUT pins
Exposed pad.
Exposed tab
—
Exposed tab
It should be connected to GND and thermal mass for enhanced thermal impedance.
It should not be used as electrical ground conduction path.
Functional Block Diagram
IN
UVLO
Current
Sense
Discharge
Control
OUT
EN
Driver
Thermal
Current
Limit
Deglitch
FLG
Sense
GND
Absolute Maximum Ratings (@T A = +25°C, unless otherwise specified.)
Symbol
ESD HBM
ESD MM
V IN
V OUT
V EN , V FLG
I LOAD
T J(MAX)
T ST
Parameter
Human Body Model ESD Protection
Machine Model ESD Protection
Input Voltage
Output Voltage
Enable Voltage
Maximum Continuous Load Current
Maximum Junction Temperature
Storage Temperature Range (Note 4)
Ratings
4
300
6.5
V IN +0.3
6.5
Internal Limited
150
-65 to +150
Units
kV
V
V
V
V
A
°C
°C
Caution:
Note:
Stresses greater than the 'Absolute Maximum Ratings' specified above, may cause permanent damage to the device. These are stress ratings only;
functional operation of the device at these or any other conditions exceeding those indicated in this specification is not implied. Device reliability may be
affected by exposure to absolute maximum rating conditions for extended periods of time.
Semiconductor devices are ESD sensitive and may be damaged by exposure to ESD events. Suitable ESD precautions should be taken when handling
and transporting these devices
4. UL Recognized Rating from -30°C to 70°C (Diodes qualified T ST from -65°C to 150°C)
AP2101/AP2111
Document number: DS32015 Rev. 3 - 2
2 of 14
January 2013
? Diodes Incorporated
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