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参数资料
| 型号： | APGRD001 |
| 厂商： | Microchip Technology |
| 文件页数： | 3/12页 |
| 文件大小： | 0K |
| 描述： | REF DESIGN PKE PIC16F639 |
| 标准包装： | 1 |
| 类型： | PKE，RKE |
| 频率： | 125kHz |
| 适用于相关产品： | PIC16F639，PIC16F636，PIC18F2680 |
| 已供物品： | 遥控钥匙、基站和接收器/解码器 |
LOW-POWER ANALOG SOLUTIONS FOR AUTOMOTIVE APPLICATIONS
Microchip Analog Solutions Cover a Broad Range of Products and Applications in Automotive Systems
Driver Information/
Mobile Multimedia
Safety/Security
ABS Controller
Airbag Crash Sensor Controller
Airbag Host Controller
LED Lighting
Lighting Controller
Parking Assist Controls
Steering Angle Sensor Controller
Tire Pressure Monitoring
Comfort/Convenience
Air Flow Controls
Battery Monitoring Controls
Compass Directional Controller
Door Locks/Mirror Controller
Passive Keyless Entry
Remote Keyless Entry/Immobilizer
Seat Positioning Controller
Window Lift Controller
Wiper Controller
CD Changer Controls
GPS Receiver Controls
Heads-Up Display Controls
MP3 Player Controls
Radio Controls
Rear Seat Entertainment Controls
Steering Wheel Controls
Powertrain
Adaptive Cruise Controls
Electric Parking Brake Controls
Electronic Power Steering Controls
Electronic Stability Controls
Engine Control Module Co-Processor
Fuel Pump Controls
Gearbox Controls
Glow Plug Controls
2002-2005 Analog Products FIT Rate Dynamic Life Test @ +150°C
Failure Rate: +55C, 60% Confidence Level, Assuming 0.7 eV
Quality to Serve the Automotive Market
Our manufacturing meets the demanding quality and
logistics requirements imposed by the automotive market
10
8
6
4
2
FIT Rate
environment. In 2003, Microchip became one of the first
semiconductor manufacturers to achieve ISO/TS-16949
certification.
Microchip Technology
Automotive Certification History
Tempe, AZ – Fab
ISO 9001 Registered (1996)
ISO/TS 16949 Registration (2003)
Recertification (2006)
0
2002
2003 2004
Calendar Year
2005
Gresham, OR – Fab
ISO/TS 16949 Registration (2004)
Recertification (2006)
Bangkok, Thailand – Assembly & Test
Stress Test Qualification
Microchip has experience with the automotive industry’s
quality requirements. Our automotive customers may
request incremental device qualification testing such as the
AEC-Q100, shown below.
AEC-Q100 Device Qualification Plan*
ISO 9002 Registered (1997)
ISO/TS 16949 Registration (2003)
Recertification (2006)
ISO 14001 (2004)
Test Name
ELFR
HTOL/DLT
EDR Endurance Cycling
EDR High-Temp Bake/
Retention Bake
EDR HTOL/DLT
ESD - HBM
ESD - MM
Latch-Up (Overvoltage)
Conditions
150oC for 24 hours; Electrical test pre- and post-stress at +25oC and +125oC.
150oC for 408 hours; Electrical test pre- and post-stress at -40, +25 and +125oC.
Readouts at 0, 96 and 408 hours.
Specified erase/write cycles at +85oC; Electrical test pre- and post-stress at +25oC and 125oC.
175oC for 504 hours; Electrical test pre- and post-stress at +25oC and +125oC.
Readouts at 0, 96 and 504 hours.
150oC for 408 hours; Electrical test pre- and post-stress at -40, +25, and +125oC.
Readouts at 0, 96 and 408 hours.
Electrical test pre- and post-stress at +25oC and +125oC. Test at each voltage: 500V, 1 KV, 2 KV, 4 KV.
Electrical test pre- and post-stress at +25oC and +125oC. Test at each voltage: 100V, 200V, 300V, 400V.
Test to ±14V and ±200 mA at +25oC and ±14V and ±100 mA at +125oC.
Electrical test pre- and post-stress at +25oC and +125oC.
*Additional package level qualification is performed per AEC-Q100 recommendation.
Automotive Applications Design Guide
3
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