参数资料
型号: AS7C3256A-8TCN
厂商: ALLIANCE SEMICONDUCTOR CORP
元件分类: DRAM
英文描述: 3.3V 32K X 8 CMOS SRAM (Common I/O)
中文描述: 32K X 8 STANDARD SRAM, 8 ns, PDSO28
封装: 8 X 13.40 MM, LEAD FREE, TSOP1-28
文件页数: 6/9页
文件大小: 301K
代理商: AS7C3256A-8TCN
AS7C3256A-8
3/22/05; v.1.0
Alliance Semiconductor
P. 6 of 9
AC test conditions
- Output load: see Figure B
- Input pulse level: GND to 3.0V. See Figure A.
- Input rise and fall times: 2 ns. See Figure A.
- Input and output timing reference levels: 1.5V.
Notes
1
2
3
4
5
6
7
8
9
10 C=30pF, except on High Z and Low Z parameters, where C=5pF.
During V
CC
power-up, a pull-up resistor to V
CC
on
CE
is required to meet I
SB
specification.
For test conditions, see
AC Test Conditions
, Figures A, B.
These parameters are specified with CL = 5pF, as in Figures B. Transition is measured
±
500mV from steady-state voltage.
This parameter is guaranteed, but not tested.
WE
is High for read cycle.
CE
and
OE
are Low for read cycle.
Address valid prior to or coincident with
CE
transition Low.
All read cycle timings are referenced from the last valid address to the first transitioning address.
All write cycle timings are referenced from the last valid address to the first transitioning address.
350
C
10
320
D
out
GND
+3.3V
168
D
out
+1.72V
Figure B: Output load
Thevenin equivalent
10%
90%
10%
90%
GND
+3.0V
Figure A: Input pulse
2 ns
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