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参数资料
| 型号： | CAT1026YI-45-GT3 |
| 厂商： | ON Semiconductor |
| 文件页数： | 6/19页 |
| 文件大小： | 0K |
| 描述： | IC SUPERVISOR CPU 2K EEPR 8TSSOP |
| 标准包装： | 3,000 |
| 类型： | 多压监控器 |
| 监视电压数目： | 2 |
| 输出： | 开路漏极或开路集电极 |
| 复位： | 高有效/低有效 |
| 复位超时： | 最小为 130 ms |
| 电压 - 阀值： | 4.5V，可调 |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 8-TSSOP（0.173"，4.40mm 宽） |
| 供应商设备封装： | 8-TSSOP |
| 包装： | 带卷 (TR) |
CAT1026, CAT1027
Table 9. RESET CIRCUIT AC CHARACTERISTICS
Symbol
t PURST
t RDP
t GLITCH
t WD
t RPD2
Parameter
Power ? Up Reset Timeout
V TH to RESET output Delay
V CC Glitch Reject Pulse Width
Watchdog Timeout
V SENSE to V LOW Delay
Test Conditions
Note 2
Note 3
Notes 4 and 5
Note 1
Note 5
Min
130
1.0
Typ
200
1.6
Max
270
5
30
2.1
5
Units
ms
m s
ns
s
m s
Table 10. POWER ? UP TIMING (Notes 6 and 7)
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
t PUR
t PUW
Power ? Up to Read Operation
Power ? Up to Write Operation
270
270
ms
ms
Table 11. AC TEST CONDITIONS
Parameter
Input Pulse Voltages
Input Rise and Fall Times
Input Reference Voltages
Output Reference Voltages
Output Load
Table 12. RELIABILITY CHARACTERISTICS
Test Conditions
0.2 x V CC to 0.8 x V CC
10 ns
0.3 x V CC , 0.7 x V CC
0.5 x V CC
Current Source: I OL = 3 mA; C L = 100 pF
Symbol
N END (Note 6)
T DR (Note 6)
V ZAP (Note 6)
I LTH (Notes 6 & 8)
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch ? Up
Reference Test Method
MIL ? STD ? 883, Test Method 1033
MIL ? STD ? 883, Test Method 1008
MIL ? STD ? 883, Test Method 3015
JEDEC Standard 17
Min
1,000,000
100
2000
100
Max
Units
Cycles/Byte
Years
Volts
mA
1.
2.
3.
4.
5.
6.
7.
8.
Test Conditions according to “AC Test Conditions” table.
Power ? up, Input Reference Voltage V CC = V TH , Reset Output Reference Voltage and Load according to “AC Test Conditions” Table
Power ? Down, Input Reference Voltage V CC = V TH , Reset Output Reference Voltage and Load according to “AC Test Conditions” Table
V CC Glitch Reference Voltage = V THmin ; Based on characterization data
0 < V SENSE ? V CC , V LOW Output Reference Voltage and Load according to “AC Test Conditions” Table.
This parameter is characterized initially and after a design or process change that affects the parameter. Not 100% tested.
t PUR and t PUW are the delays required from the time V CC is stable until the specified memory operation can be initiated.
Latch ? up protection is provided for stresses up to 100 mA on input and output pins from ? 1 V to V CC + 1 V.
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相关代理商/技术参数 |
参数描述 |
|---|---|
| CAT1026YI-45-T3 | 制造商:ON Semiconductor 功能描述:CPU SUPERVISOR WITH 2K EEPROM - Tape and Reel |
| CAT1026YI-45TE13 | 功能描述:监控电路 2K bit 4.5V Ind Temp RoHS:否 制造商:STMicroelectronics 监测电压数: 监测电压: 欠电压阈值: 过电压阈值: 输出类型:Active Low, Open Drain 人工复位:Resettable 监视器:No Watchdog 电池备用开关:No Backup 上电复位延迟（典型值）:10 s 电源电压-最大:5.5 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:UDFN-6 封装:Reel |
| CAT1026ZD4I-25T3 | 制造商:ON Semiconductor 功能描述:CPU SUPERVISOR WITH 2K EEPROM - Tape and Reel |
| CAT1026ZD4I-28T3 | 制造商:ON Semiconductor 功能描述:CPU SUPERVISOR WITH 2K EEPROM - Tape and Reel |
| CAT1026ZD4I-30T3 | 制造商:ON Semiconductor 功能描述:CPU SUPERVISOR WITH 2K EEPROM - Tape and Reel |
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