参数资料
| 型号： | CAT25256LI-G |
| 厂商： | ON Semiconductor |
| 文件页数： | 2/20页 |
| 文件大小： | 0K |
| 描述： | IC EEPROM 256KBIT 10MHZ 8DIP |
| 标准包装： | 50 |
| 格式 - 存储器： | EEPROMs - 串行 |
| 存储器类型： | EEPROM |
| 存储容量： | 256K (32K x 8) |
| 速度： | 10MHz |
| 接口： | SPI 3 线串行 |
| 电源电压： | 1.8 V ~ 5.5 V |
| 工作温度： | -40°C ~ 85°C |
| 封装/外壳： | 8-DIP（0.300"，7.62mm） |
| 供应商设备封装： | 8-PDIP |
| 包装： | 管件 |
| 产品目录页面： | 808 (CN2011-ZH PDF) |
CAT25256
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameters
Operating Temperature
Storage Temperature
Voltage on any Pin with Respect to Ground (Note 1)
Ratings
? 45 to +130
? 65 to +150
? 0.5 to +6.5
Units
° C
° C
V
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. The DC input voltage on any pin should not be lower than ? 0.5 V or higher than V CC + 0.5 V. During transitions, the voltage on any pin may
undershoot to no less than ? 1.5 V or overshoot to no more than V CC + 1.5 V, for periods of less than 20 ns.
Table 2. RELIABILITY CHARACTERISTICS (Note 2)
Symbol
N END (Note 3, 4)
T DR
Endurance
Data Retention
Parameter
Min
1,000,000
100
Units
Program / Erase Cycles
Years
2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC ? Q100
and JEDEC test methods.
3. Page Mode, V CC = 5 V, 25 ° C.
4. The new product revision (E) uses ECC (Error Correction Code) logic with 6 ECC bits to correct one bit error in 4 data bytes. Therefore, when
a single byte has to be written, 4 bytes (including the ECC bits) are re ? programmed. It is recommended to write by multiple of 4 bytes in order
to benefit from the maximum number of write cycles.
Table 3. D.C. OPERATING CHARACTERISTICS ? MATURE PRODUCT
( V CC = 1.8 V to 5.5 V, T A = ? 40 ° C to +85 ° C and V CC = 2.5 V to 5.5 V, T A = ? 40 ° C to +125 ° C, unless otherwise specified.)
Symbol
Parameter
Test Conditions
Min
Max
Units
I CCR
I CCW
I SB1
I SB2
I L
Supply Current
(Read Mode)
Supply Current
(Write Mode)
Standby Current
Standby Current
Input Leakage Current
Read, V CC = 5.5 V,
SO open
Write, V CC = 5.5 V,
SO open
V IN = GND or V C C , CS = V CC ,
WP = V CC , HOLD = V CC ,
V CC = 5.5 V
V IN = GND or V CC , CS = V CC ,
WP = GND, HOLD = GND,
V CC = 5.5 V
V IN = GND or V CC
10 MHz / ? 40 ° C to 85 ° C
5 MHz / ? 40 ° C to 125 ° C
10 MHz / ? 40 ° C to 85 ° C
5 MHz / ? 40 ° C to 125 ° C
T A = ? 40 ° C to +85 ° C
T A = ? 40 ° C to +125 ° C
T A = ? 40 ° C to +85 ° C
T A = ? 40 ° C to +125 ° C
? 2
2
2
4
4
1
3
4
5
2
mA
mA
mA
mA
m A
m A
m A
m A
m A
I LO
Output Leakage
Current
CS = V CC ,
V OUT = GND or V CC
T A = ? 40 ° C to +85 ° C
T A = ? 40 ° C to +125 ° C
? 1
? 1
1
2
m A
m A
V IL
V IH
V OL1
Input Low Voltage
Input High Voltage
Output Low Voltage
V CC > 2.5 V, I OL = 3.0 mA
? 0.5
0.7 V CC
0.3 V CC
V CC + 0.5
0.4
V
V
V
V OH1
V OL2
V OH2
Output High Voltage
Output Low Voltage
Output High Voltage
V CC > 2.5 V, I OH = ? 1.6 mA
V CC > 1.8 V, I OL = 150 m A
V CC > 1.8 V, I OH = ? 100 m A
V CC ? 0.8 V
V CC ? 0.2 V
0.2
V
V
V
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| CAT25256LI-G | 制造商:ON Semiconductor 功能描述:IC EEPROM 256KBIT SERIAL 10MHZ DIP-8 制造商:ON Semiconductor 功能描述:IC, EEPROM, 256KBIT, SERIAL, 10MHZ DIP-8 |
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| CAT25256XE | 制造商:ON Semiconductor 功能描述: |
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