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| 型号： | DC1571A-A |
| 厂商： | Linear Technology |
| 文件页数： | 5/24页 |
| 文件大小： | 0K |
| 描述： | BOARD SAR ADC LTC2383-16 |
| 软件下载： | QuikEval II System |
| 设计资源： | DC1571A Design Files DC1571A Schematic |
| 标准包装： | 1 |
| 系列： | QuikEval™ |
| ADC 的数量： | 1 |
| 位数： | 16 |
| 采样率（每秒）： | 1M |
| 数据接口： | 串行，SPI? |
| 输入范围： | ±2.5 V |
| 在以下条件下的电源（标准）： | 13mW @ 1MSPS |
| 工作温度： | 0°C ~ 70°C |
| 已用 IC / 零件： | LTC2383-16 |
| 已供物品： | 板 |
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LTC2383-16
13
238316f
APPLICATIONS INFORMATION
Table 2. SNR, THD vs RIN for ±10V Single-Ended Input Signal.
RIN
(Ω)
R1
(Ω)
R2
(Ω)
R3
(Ω)
R4
(Ω)
SNR
(dB)
THD
(dB)
10k
1.24k
10k
1.1k
92
–96
50k
6.19k
50k
5.49k
91
–96
100k
12.4k
100k
11k
91
–96
ADC REFERENCE
The LTC2383-16 requires an external reference to define its
input range. A low noise, low temperature drift reference
is critical to achieving the full datasheet performance
of the ADC. Linear Technology offers a portfolio of high
performance references designed to meet the needs of
many applications. With its small size, low power and high
accuracy, the LTC6652-2.5 is particularly well suited for
use with the LTC2383-16. The LTC6652-2.5 offers 0.05%
(max) initial accuracy and 5ppm/°C (max) temperature
coefficient for high precision applications. The LTC6652-2.5
is fully specified over the H-grade temperature range and
complements the extended temperature operation of the
LTC2383-16 up to 125°C. We recommend bypassing the
LTC6652-2.5 with a 47μF ceramic capacitor (X5R, 0805
size) close to the REF pin. All performance curves shown
in this datasheet were obtained using the LTC6652-2.5.
The REF pin of the LTC2383-16 draws charge (QCONV)
from the 47μF bypass capacitor during each conversion
cycle. The reference replenishes this charge with a DC
current, IREF = QCONV/tCYC. The DC current draw of the
REF pin, IREF, depends on the sampling rate and output
code. If the LTC2383-16 is used to continuously sample
a signal at a constant rate, the LTC6652-2.5 will keep the
deviation of the reference voltage over the entire code
span to less than 0.5LSBs.
When idling, the REF pin on the LTC2383-16 draws only a
small leakage current (< 1μA). In applications where a burst
of samples is taken after idling for long periods as shown
in Figure 8, IREF quickly goes from approximately 0μA to
a maximum of 910μA at 1Msps. This step in DC current
draw triggers a transient response in the reference that
must be considered since any deviation in the reference
output voltage will affect the accuracy of the output code. In
applications where the transient response of the reference
is important, the fast settling LTC6655-2.5 reference
is recommended. Inserting a 1Ω resistor between the
47μF bypass capacitor and reference output as shown in
Figure 9 helps to improve the transient settling time and
minimize the reference voltage deviation.
CNV
IDLE
PERIOD
IDLE
PERIOD
238316 F08
Figure 8. CNV Waveform Showing Burst Sampling
238316 F09
LTC2383-16
1Ω
47μF
LTC6655-2.5
VOUT_S
VOUT_F
Figure 9. LTC6655-2.5 Driving REF of LTC2381-16
DYNAMIC PERFORMANCE
Fast Fourier Transform (FFT) techniques are used to test
the ADC’s frequency response, distortion and noise at the
rated throughput. By applying a low distortion sine wave
and analyzing the digital output using an FFT algorithm, the
ADC’s spectral content can be examined for frequencies
outside the fundamental. The LTC2383-16 provides
guaranteed tested limits for both AC distortion and noise
measurements.
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