参数资料
型号: DS2705U+T&R
厂商: Maxim Integrated Products
文件页数: 11/18页
文件大小: 0K
描述: IC AUTHENTICATE SHA-1 8-UMAX
产品培训模块: Lead (SnPb) Finish for COTS
Obsolescence Mitigation Program
标准包装: 3,000
功能: 电池验证
电池化学: 所有电池类型
电源电压: 2.5 V ~ 5.5 V
工作温度: -20°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 8-TSSOP,8-MSOP(0.118",3.00mm 宽)
供应商设备封装: 8-uMAX
包装: 带卷 (TR)
DS2705: SHA-1 Authentication Master
MAC Comparison
After the SHA-1 computation is completed by the remote token, the DS2705 and remote SHA-1 token both contain
a MAC result based on the secret key. The results are compared by the DS2705 on a bit by bit basis as the MAC
data is read in from the remote token. Note that the secret is never transmitted on the bus and thus cannot be
captured by observing bus traffic.
Multiple Authentication Attempts
The DS2705 is configurable for multiple authentication attempts or re-tries to avoid reporting authentication failure
in the event of contact bounce or a noisy communication channel. When configured for more than one retry, the
status outputs are kept at the previous state until one attempt succeeds or all attempts fail. It is always
recommended to configure the DS2705 for at least one retry.
Signaling Authentication Results
Authentication results are signaled on the open drain PASS and FAIL output pins. During an authentication attempt,
both outputs remain at their previous state. After authentication is complete, the pass or fail status is reported until
the display is cleared by one of the following conditions:
CHAL pin returning to inactive logic level.
Battery token removal detected when no 1-Wire Presence Pulse is returned in response to a 1-Wire
Reset.
Table 4. PASS/FAIL Outputs
CONDITION
Token Not Present
Authentication in
Progress
Complete: Pass
Complete: Fail
FOM BIT
x
x
x
0
1
PASS OUTPUT
Hi-Z
No Change
LOW
Hi-Z
Hi-Z
FAIL OUTPUT
Hi-Z
No Change
Hi-Z
LOW
Pulse
PROGRAMMING AND CONFIGURING
The DS2705 requires a configuration step prior to deployment to program the 64-bit challenge, 160-bit response
and to set up desired configuration options. Configuration is performed in slave mode using the SDQ and VPP
pins. The Challenge-and-Response pair, and option data are programmed in on-chip EEPROM that requires an
externally supplied programming voltage. After programming and verifying the EEPROM data, setting of the Lock
bits is recommended to prevent future modification. SDQ and VPP have internal pull downs which prevent the pins
from floating during normal operation.
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