参数资料
型号: DS3152N+
厂商: Maxim Integrated Products
文件页数: 29/61页
文件大小: 0K
描述: IC LIU DS3/E3/STS-1 144-CSBGA
产品培训模块: Lead (SnPb) Finish for COTS
Obsolescence Mitigation Program
标准包装: 160
类型: 线路接口装置(LIU)
驱动器/接收器数: 2/2
规程: DS3
电源电压: 3.135 V ~ 3.465 V
安装类型: 表面贴装
封装/外壳: 144-BGA,CSPBGA
供应商设备封装: 144-TECSBGA(13x13)
包装: 托盘
DS3151/DS3152/DS3153/DS3154 Single/Dual/Triple/Quad DS3/E3/STS-1 LIUs
35 of 61
12.3
JTAG Instruction Register and Instructions
The instruction register contains a shift register as well as a latched parallel output and is 3 bits in length. When the
TAP controller enters the Shift-IR state, the instruction shift register is connected between JTDI and JTDO. While in
the Shift-IR state, a rising edge on JTCLK with JTMS low shifts data one stage toward the serial output at JTDO. A
rising edge on JTCLK in the Exit1-IR state or the Exit2-IR state with JTMS high moves the controller to the Update-
IR state. The falling edge of that same JTCLK latches the data in the instruction shift register to the instruction
parallel output. Table 12-A shows the instructions supported by the DS315x and their respective operational binary
codes.
Table 12-A. JTAG Instruction Codes
INSTRUCTIONS
SELECTED REGISTER
INSTRUCTION CODES
SAMPLE/PRELOAD
Boundary Scan
010
BYPASS
Bypass
111
EXTEST
Boundary Scan
000
CLAMP
Bypass
011
HIGHZ
Bypass
100
IDCODE
Device Identification
001
SAMPLE/PRELOAD. SAMPLE/RELOAD is a mandatory instruction for the IEEE 1149.1 specification. This
instruction supports two functions. The digital I/Os of the device can be sampled at the boundary scan register
without interfering with the device’s normal operation by using the Capture-DR state. SAMPLE/PRELOAD also
allows the DS315x to shift data into the boundary scan register through JTDI using the Shift-DR state.
EXTEST. EXTEST allows testing of the interconnections to the device. When the EXTEST instruction is latched in
the instruction register, the following actions occur. Once enabled through the Update-IR state, the parallel outputs
of the digital output pins are driven. The boundary scan register is connected between JTDI and JTDO. The
Capture-DR samples all digital inputs into the boundary scan register.
BYPASS. When the BYPASS instruction is latched into the parallel instruction register, JTDI connects to JTDO
through the 1-bit bypass test register. This allows data to pass from JTDI to JTDO without affecting the device’s
normal operation.
IDCODE. When the IDCODE instruction is latched into the parallel instruction register, the identification test
register is selected. The device identification code is loaded into the identification register on the rising edge of
JTCLK, following entry into the Capture-DR state. Shift-DR can be used to shift the identification code out serially
through JTDO. During Test-Logic-Reset, the identification code is forced into the instruction register’s parallel
output.
HIGHZ. All digital outputs are placed into a high-impedance state. The bypass register is connected between JTDI
and JTDO.
CLAMP. All digital output pins output data from the boundary scan parallel output while connecting the bypass
register between JTDI and JTDO. The outputs do not change during the CLAMP instruction.
Table 12-B. JTAG ID Code
PART
REVISION
DEVICE CODE
MANUFACTURER CODE
REQUIRED
DS3154
Consult factory
0000000000110011
00010100001
1
DS3153
Consult factory
0000000000110010
00010100001
1
DS3152
Consult factory
0000000000110000
00010100001
1
DS3151
Consult factory
0000000000100000
00010100001
1
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