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| 型号： | EP1K50TI144-1DX |
| 英文描述： | Field Programmable Gate Array (FPGA) |
| 中文描述： | 现场可编程门阵列（FPGA） |
| 文件页数： | 40/86页 |
| 文件大小： | 1263K |
| 代理商： | EP1K50TI144-1DX |
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Altera Corporation
45
ACEX 1K Programmable Logic Device Family Data Sheet
Development
13
Tools
Generic Testing
Each ACEX 1K device is functionally tested. Complete testing of each
configurable static random access memory (SRAM) bit and all logic
functionality ensures 100% yield. AC test measurements for ACEX 1K
devices are made under conditions equivalent to those shown in
Figure 21. Multiple test patterns can be used to configure devices during
all stages of the production flow.
Figure 21. ACEX 1K AC Test Conditions
Operating
Conditions
recommended operating conditions, DC operating conditions, and
capacitance for 2.5-V ACEX 1K devices.
To Test
System
C1 (includes
JIG capacitance)
Device input
rise and fall
times < 3 ns
Device
Output
703
8.06 k
[481
]
[481
]
VCCIO
Power supply transients can affect AC
measurements. Simultaneous transitions of
multiple outputs should be avoided for
accurate measurement. Threshold tests
must not be performed under AC
conditions. Large-amplitude, fast-ground-
current transients normally occur as the
device outputs discharge the load
capacitances. When these transients ow
through the parasitic inductance between
the device ground pin and the test system
ground, signicant reductions in
observable noise immunity can result.
Numbers in brackets are for 2.5-V devices
or outputs. Numbers without brackets are
for 3.3-V devices or outputs.
Table 18. ACEX 1K Device Absolute Maximum Ratings
Symbol
Parameter
Conditions
Min
Max
Unit
VCCINT
Supply voltage
With respect to ground (2)
–0.5
3.6
V
VCCIO
–0.5
4.6
V
VI
DC input voltage
–2.0
5.75
V
IOUT
DC output current, per pin
–25
25
mA
TSTG
Storage temperature
No bias
–65
150
°
C
TAMB
Ambient temperature
Under bias
–65
135
°
C
TJ
Junction temperature
PQFP, TQFP, and BGA packages, under
bias
135
°
C
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| EP1K50FC256-1DX | Dual LDO with Low Noise, Low IQ, and High PSRR; Temperature Range: -40°C to 85°C; Package: 10-DFN |
| EP1K50FC256-1F | Field Programmable Gate Array (FPGA) |
| EP1K50FC256-1P | Field Programmable Gate Array (FPGA) |
| EP1K50FC256-1X | Field Programmable Gate Array (FPGA) |
| EP1K50FC256-2DX | Field Programmable Gate Array (FPGA) |
相关代理商/技术参数 |
参数描述 |
|---|---|
| EP1K50TI144-1F | 制造商:未知厂家 制造商全称:未知厂家 功能描述:Field Programmable Gate Array (FPGA) |
| EP1K50TI144-1P | 制造商:未知厂家 制造商全称:未知厂家 功能描述:Field Programmable Gate Array (FPGA) |
| EP1K50TI144-1X | 制造商:未知厂家 制造商全称:未知厂家 功能描述:Field Programmable Gate Array (FPGA) |
| EP1K50TI144-2 | 功能描述:FPGA - 现场可编程门阵列 FPGA - ACEX 1K 360 LABs 102 IOs RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 栅极数量: 逻辑块数量:943 内嵌式块RAM - EBR:1956 kbit 输入/输出端数量:128 最大工作频率:800 MHz 工作电源电压:1.1 V 最大工作温度:+ 70 C 安装风格:SMD/SMT 封装 / 箱体:FBGA-256 |
| EP1K50TI144-2DX | 制造商:未知厂家 制造商全称:未知厂家 功能描述:Field Programmable Gate Array (FPGA) |
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