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参数资料
| 型号： | EVAL-AD5433EBZ |
| 厂商： | Analog Devices Inc |
| 文件页数： | 10/29页 |
| 文件大小： | 0K |
| 描述： | BOARD EVAL FOR AD5433 |
| 产品培训模块： | DAC Architectures |
| 标准包装： | 1 |
| DAC 的数量： | 1 |
| 位数： | 10 |
| 采样率（每秒）： | 20.4M |
| 数据接口： | 并联 |
| 设置时间： | 35ns |
| DAC 型： | 电流 |
| 工作温度： | -40°C ~ 125°C |
| 已供物品： | 板，CD |
| 已用 IC / 零件： | AD5433 |
| 相关产品： | AD5433YRUZ-ND - IC DAC 10BIT MULTIPLYING 20TSSOP AD5433YCPZ-ND - IC DAC 10BIT MULTIPLYING 20LFCSP AD5433YRUZ-REEL7-ND - IC DAC 10BIT MULTIPLYING 20TSSOP AD5433YRUZ-REEL-ND - IC DAC 10BIT MULTIPLYING 20TSSOP AD5433YRU-REEL-ND - IC DAC 10BIT MULTIPLYING 20TSSOP AD5433YRU-ND - IC DAC 10BIT MULTIPLYING 20TSSOP |
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Data Sheet
AD5424/AD5433/AD5445
Rev. D | Page 17 of 28
TERMINOLOGY
Relative Accuracy
Relative accuracy or endpoint nonlinearity is a measure of the
maximum deviation from a straight line passing through the
endpoints of the DAC transfer function. It is measured after
adjusting zero scale and full scale and is normally expressed in
LSBs or as a percentage of full-scale reading.
Differential Nonlinearity
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of –1 LSB maximum
over the operating temperature range ensures monotonicity.
Gain Error
Gain error or full-scale error is a measure of the output error
between an ideal DAC and the actual device output. For these
DACs, ideal maximum output is VREF – 1 LSB. Gain error of the
DACs is adjustable to 0 with external resistance.
Output Leakage Current
Output leakage current is current that flows in the DAC ladder
switches when these are turned off. For the IOUT1 terminal, it
can be measured by loading all 0s to the DAC and measuring
the IOUT1 current. Minimum current flows in the IOUT2 line
when the DAC is loaded with all 1s.
Output Capacitance
Capacitance from IOUT1, or IOUT2, to AGND.
Output Current Settling Time
This is the amount of time it takes for the output to settle to a
specified level for a full-scale input change. For these devices, it
is specified with a 100 resistor to ground.
The settling time specification includes the digital delay from
the CS rising edge to the full-scale output change.
Digital-to-Analog Glitch lmpulse
The amount of charge injected from the digital inputs to the
analog output when the inputs change state. This is normally
specified as the area of the glitch in either pA seconds or nV
seconds, depending upon whether the glitch is measured as a
current or voltage signal.
Digital Feedthrough
When the device is not selected, high frequency logic activity
on the device digital inputs may be capacitively coupled
through the device to show up as noise on the IOUT pins and
subsequently in the following circuitry. This noise is called
digital feedthrough.
Multiplying Feedthrough Error
This is the error due to capacitive feedthrough from the DAC
reference input to the DAC IOUT1 terminal when all 0s are
loaded to the DAC.
Total Harmonic Distortion (THD)
The DAC is driven by an ac reference. The ratio of the rms sum
of the harmonics of the DAC output to the fundamental value is
the THD. Usually only the lower order harmonics are included,
such as second to fifth.
(
)
1
2
5
2
4
2
3
2
log
20
V
THD
+
=
Digital Intermodulation Distortion
Second-order intermodulation distortion (IMD) measurements
are the relative magnitude of the fa and fb tones generated
digitally by the DAC and the second-order products at 2fa fb
and 2fb fa.
Spurious-Free Dynamic Range (SFDR)
SFDR is the usable dynamic range of a DAC before spurious
noise interferes or distorts the fundamental signal. It is measured
by the difference in amplitude between the fundamental and the
largest harmonically or nonharmonically related spur from dc
to full Nyquist bandwidth (half the DAC sampling rate, or fS/2).
Narrow-band SFDR is a measure of SFDR over an arbitrary
window size, in this case, 50% of the fundamental. Digital SFDR
is a measure of the usable dynamic range of the DAC when the
signal is a digitally generated sine wave.
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相关代理商/技术参数 |
参数描述 |
|---|---|
| EVAL-AD5439EB | 制造商:Analog Devices 功能描述:EVAL BD FOR AD5439 DAC - Bulk |
| EVAL-AD5440EB | 制造商:Analog Devices 功能描述: |
| EVAL-AD5440EBZ | 制造商:Analog Devices 功能描述:EVAL BD FOR 8-/10-/12-BIT, PARALLEL INPUT, DUAL-CH, CURRENT - Bulk |
| EVAL-AD5443-DBRDZ | 功能描述:BOARD EVAL CARD CLINUX/STAMP RoHS:是 类别:编程器，开发系统 >> 评估板 - 数模转换器 (DAC) 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:1 系列:- DAC 的数量:4 位数:12 采样率（每秒）:- 数据接口:串行，SPI? 设置时间:3µs DAC 型:电流/电压 工作温度:-40°C ~ 85°C 已供物品:板 已用 IC / 零件:MAX5581 |
| EVAL-AD5443EB | 制造商:Analog Devices 功能描述:EVAL BD FOR AD5443, 0BIT HIGH BANDWIDTH MULTIPLYING DACS W/ - Bulk |
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