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参数资料
| 型号： | EVAL-AD5781SDZ |
| 厂商： | Analog Devices Inc |
| 文件页数： | 9/28页 |
| 文件大小： | 0K |
| 描述： | BOARD EVAL FOR AD5781 |
| 标准包装： | 1 |
| DAC 的数量： | 1 |
| 位数： | 18 |
| 数据接口： | DSP，MICROWIRE?，QSPI?，串行，SPI? |
| 设置时间： | 1µs |
| DAC 型： | 电压 |
| 工作温度： | -40°C ~ 125°C |
| 已供物品： | 板，CD |
| 已用 IC / 零件： | AD5781 |
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Data Sheet
AD5781
Rev. D | Page 17 of 28
TERMINOLOGY
Relative Accuracy
Relative accuracy, or integral nonlinearity (INL), is a measure of
the maximum deviation, in LSB, from a straight line passing
through the endpoints of the DAC transfer function. A typical
INL error vs. code plot is shown in Figure 5.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic. A
typical DNL error vs. code plot is shown in Figure 9.
Linearity Error Long-Term Stability
Linearity error long-term stability is a measure of the stability of
the linearity of the DAC over a long period of time. It is
specified in LSB for a time period of 500 hours and 1000 hours
at an elevated ambient temperature.
Zero-Scale Error
Zero-scale error is a measure of the output error when zero-scale
code (0x00000) is loaded to the DAC register. Ideally, the output
voltage should be VREFNS. Zero-scale error is expressed in LSBs.
Zero-Scale Error Temperature Coefficient
Zero-scale error temperature coefficient is a measure of the
change in zero-scale error with a change in temperature. It is
expressed in ppm FSR/°C.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (0x3FFFF) is loaded to the DAC register. Ideally, the
output voltage should be VREFPS 1 LSB. Full-scale error is
expressed in LSBs.
Full-Scale Error Temperature Coefficient
Full-scale error temperature coefficient is a measure of the
change in full-scale error with a change in temperature. It is
expressed in ppm FSR/°C.
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from ideal,
expressed in ppm of the full-scale range.
Gain Error Temperature Coefficient
Gain error temperature coefficient is a measure of the change in
gain error with a change in temperature. It is expressed in ppm
FSR/°C.
Midscale Error
Midscale error is a measure of the output error when midscale
code (0x20000) is loaded to the DAC register. Ideally, the output
voltage should be (VREFPS – VREFNS)/2 +VREFNS. Midscale error is
expressed in LSBs.
Midscale Error Temperature Coefficient
Midscale error temperature coefficient is a measure of the
change in mid-scale error with a change in temperature. It is
expressed in ppm FSR/°C.
Output Slew Rate
Slew rate is a measure of the limitation in the rate of change of
the output voltage. The slew rate of the AD5781 output voltage
is determined by the capacitive load presented to the VOUT pin.
The capacitive load in conjunction with the 3.4 k output
impedance of the AD5781 set the slew rate. Slew rate is
measured from 10% to 90% of the output voltage change and is
expressed in V/s.
Output Voltage Settling Time
Output voltage settling time is the amount of time it takes for
the output voltage to settle to a specified level for a specified
change in voltage. For fast settling applications, a high speed
buffer amplifier is required to buffer the load from the 3.4 k
output impedance of the AD5781, in which case, it is the
amplifier that determines the settling time.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is specified as the area of the glitch in nV-sec and is
measured when the digital input code is changed by 1 LSB at
the major carry transition (see Figure 42).
Output Enabled Glitch Impulse
Output enabled glitch impulse is the impulse injected into the
analog output when the clamp to ground on the DAC output is
removed. It is specified as the area of the glitch in nV-sec (see
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC but is measured when the DAC output is not updated. It is
specified in nV-sec and measured with a full-scale code change
on the data bus, that is, from all 0s to all 1s, and vice versa.
Spurious Free Dynamic Range (SFDR)
Spurious free dynamic range is the usable dynamic range of a
DAC before spurious noise interferes or distorts the fundamental
signal. It is measured by the difference in amplitude between the
fundamental and the largest harmonically or nonharmonically
related spur from dc to full Nyquist bandwidth (half the DAC
sampling rate, or fS/2). SFDR is measured when the signal is a
digitally generated sine wave.
Total Harmonic Distortion (THD)
Total harmonic distortion is the ratio of the rms sum of the
harmonics of the DAC output to the fundamental value. Only
the second to fifth harmonics are included.
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