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| 型号： | FDV303N |
| 厂商： | Fairchild Semiconductor |
| 文件页数： | 1/4页 |
| 文件大小： | 0K |
| 描述： | MOSFET N-CH 25V 680MA SOT-23 |
| 产品培训模块： | High Voltage Switches for Power Processing |
| 产品变化通告： | Mold Compound Change 12/Dec/2007 |
| 产品目录绘图： | SuperSOT-3, SOT-23 |
| 标准包装： | 1 |
| FET 型： | MOSFET N 通道，金属氧化物 |
| FET 特点： | 逻辑电平门 |
| 漏极至源极电压(Vdss)： | 25V |
| 电流 - 连续漏极(Id) @ 25° C： | 680mA |
| 开态Rds（最大）@ Id, Vgs @ 25° C： | 450 毫欧 @ 500mA，4.5V |
| Id 时的 Vgs(th)（最大）： | 1.5V @ 250µA |
| 闸电荷(Qg) @ Vgs： | 2.3nC @ 4.5V |
| 输入电容 (Ciss) @ Vds： | 50pF @ 10V |
| 功率 - 最大： | 350mW |
| 安装类型： | 表面贴装 |
| 封装/外壳： | TO-236-3，SC-59，SOT-23-3 |
| 供应商设备封装： | SOT-23 |
| 包装： | 标准包装 |
| 产品目录页面： | 1602 (CN2011-ZH PDF) |
| 其它名称： | FDV303NDKR |
August 1997
FDV303N
Digital FET, N-Channel
General Description
These N-Channel enhancement mode field effect transistors are
produced using Fairchild's proprietary, high cell density, DMOS
technology. This very high density process is tailored to minimize
on-state resistance at low gate drive conditions. This device is
designed especially for application in battery circuits using either
one lithium or three cadmium or NMH cells. It can be used as an
inverter or for high-efficiency miniature discrete DC/DC
conversion in compact portable electronic devices like cellular
phones and pagers. This device has excellent on-state
resistance even at gate drive voltages as low as 2.5 volts.
Features
25 V, 0.68 A continuous, 2 A Peak.
R DS(ON) = 0.45 ? @ V GS = 4.5 V
R DS(ON) = 0.6 ? @ V GS = 2.7 V .
Very low level gate drive requirements allowing direct
operation in 3V circuits. V GS(th) < 1.5V.
Gate-Source Zener for ESD ruggedness.
>6kV Human Body Model
Compact industry standard SOT-23 surface mount
package.
Alternative to TN0200T and TN0201T.
SOT-23
SuperSOT TM -6
SuperSOT TM -8
SO-8
SOT-223
SOIC-16
Mark:303
D
G
S
Absolute Maximum Ratings
T A = 25 o C unless other wise noted
Symbol
V DSS
V GSS
Parameter
Drain-Source Voltage, Power Supply Voltage
Gate-Source Voltage, V IN
FDV303N
25
8
Units
V
V
I D
Drain/Output Current
- Continuous
0.68
A
- Pulsed
2
P D
T J ,T STG
ESD
Maximum Power Dissipation
Operating and Storage Temperature Range
Electrostatic Discharge Rating MIL-STD-883D
0.35
-55 to 150
6.0
W
°C
kV
Human Body Model (100pf / 1500 Ohm)
THERMAL CHARACTERISTICS
R θ JA
Thermal Resistance, Junction-to-Ambient
357
°C/W
? 1997 Fairchild Semiconductor Corporation
FDV303N Rev.D1
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相关代理商/技术参数 |
参数描述 |
|---|---|
| FDV303N | 制造商:Fairchild Semiconductor Corporation 功能描述:MOSFET N DIGITAL SOT-23 |
| FDV303N_NB9U008 | 功能描述:MOSFET N-Ch Digital RoHS:否 制造商:STMicroelectronics 晶体管极性:N-Channel 汲极/源极击穿电压:650 V 闸/源击穿电压:25 V 漏极连续电流:130 A 电阻汲极/源极 RDS（导通）:0.014 Ohms 配置:Single 最大工作温度: 安装风格:Through Hole 封装 / 箱体:Max247 封装:Tube |
| FDV303N_Q | 功能描述:MOSFET N-Ch Digital RoHS:否 制造商:STMicroelectronics 晶体管极性:N-Channel 汲极/源极击穿电压:650 V 闸/源击穿电压:25 V 漏极连续电流:130 A 电阻汲极/源极 RDS（导通）:0.014 Ohms 配置:Single 最大工作温度: 安装风格:Through Hole 封装 / 箱体:Max247 封装:Tube |
| FDV303NFSC | 制造商:Fairchild Semiconductor Corporation 功能描述: |
| FDV303NNB9U008 | 制造商:Fairchild Semiconductor Corporation 功能描述:Trans MOSFET N-CH 25V 0.68A 3-Pin SOT-23 T/R |
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