FS7140, FS7145
http://onsemi.com
4
Table 4. DC ELECTRICAL SPECIFICATIONS (Note 1) Parameter
Symbol
Conditions/Description
Min
Typ
Max
Units
OVERALL
Supply current, dynamic
IDD
CMOS mode; FXTAL = 15 MHz; FVCO
= 400 MHz; FCLK = 200 MHz; does
not include load current
35
mA
Supply current, static
IDDL
SHUT1, SHUT2 bit both “1”
400
700
mA
SERIAL COMMUNICATION I/O (SDA, SCL)
Highlevel input voltage
VIH
0.8*VDD
V
Lowlevel input voltage
VIL
0.2*VDD
V
Hysteresis voltage
Vhys
0.33*VDD
V
Input leakage current
II
SDA, SCL in read condition
10
+10
mA
Lowlevel output sink current (SDA)
IOL
SDA in acknowledge condition;
VSDA = 0.4 V
5
14
mA
ADDRESS SELECT INPUT (ADDR0, ADDR1)
Highlevel input voltage
VIH
VDD1.0
V
Lowlevel input voltage
VIL
0.8
V
Highlevel input current (pulldown)
IIH
VADDRx = VDD
30
mA
Lowlevel input current
IIL
VADDRx = 0 V
1
mA
REFERENCE FREQUENCY INPUT (REF)
Highlevel input voltage
VIH
VDD1.0
V
Lowlevel input voltage
VIL
0.8
V
Highlevel input current
IIH
VREF = VDD
1
mA
Lowlevel input current (pulldown)
IIL
VREF = 0 V
30
mA
SYNC CONTROL INPUT (SYNC)
Highlevel input voltage
VIH
VDD1.0
V
Lowlevel input voltage
VIL
0.8
V
Highlevel input current
IIH
VREF = VDD
1
mA
Lowlevel input current (pulldown)
IIL
VREF = 0 V
30
mA
CRYSTAL OSCILLATOR INPUT (XIN)
Threshold bias voltage
VTH
VDD/2
V
Highlevel input current
IIH
VXIN = VDD
40
mA
Lowlevel input current
IIL
VXIN = GND
40
mA
Crystal frequency
FX
Fundamental mode
35
MHz
Recommended crystal load
capacitance*
CL(XTAL)
For best matching with internal crystal
oscillator load
1618
pF
CRYSTAL OSCILLATOR OUTPUT (XOUT)
Highlevel output source current
IOH
VXOUT = 0
8.5
mA
Lowlevel output sink current
IOL
VXOUT = VDD
11
mA
PECL CURRENT PROGRAM I/O (IPRG)
Lowlevel input current
IIL
VIPRG = 0 V; PECL mode
10
mA
CLOCK OUTPUTS, CMOS MODE (CLKN, CLKP)
Highlevel output source current
IOH
VO = 2.0 V
19
mA
1. Unless otherwise stated, VDD = 3.3 V ± 10%, no load on any output, and ambient temperature range TA = 0°C to 70°C. Parameters denoted with an asterisk (*) represent nominal characterization data and are not production tested to any specific limits. MIN and MAX characteriza-
tion data are ± 3s from typical. Negative currents indicate flows out of the device.