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参数资料
| 型号： | FSTUD32450GX |
| 英文描述： | BUS SWITCH|CMOS|BGA|114PIN|PLASTIC |
| 中文描述： | 总线开关|的CMOS | BGA封装| 114PIN |塑料 |
| 文件页数： | 11/13页 |
| 文件大小： | 474K |
| 代理商： | FSTUD32450GX |
11
www.fairchildsemi.com
F
Undershoot Characteristic
(Note 11)
Note 11:
This test is intended to characterize the device
’
s protective capabilities by maintaining output signal integrity during an input transient voltage
undershoot event.
FIGURE 1.
Device Test Conditions
Transient
Input Voltage (V
IN
) Waveform
AC Loading and Waveforms
Note:
Input driven by 50
source terminated in 50
Note:
C
L
includes load and stray capacitance
Note:
Input Frequency
=
1.0 MHz, t
W
=
500 ns
FIGURE 2. AC Test Circuit
FIGURE 3. AC Waveforms
Symbol
V
OUTU
Parameter
Min
2.5
TBD
Typ
Max
Units
V
V
Conditions
Output Voltage During Undershoot
V
OH
0.3
TBD
S
2
=
S
5
=
0V, Figure 1
S
2
=
S
5
=
V
CC
Parameter
V
IN
R
1
=
R
2
V
TRI
V
CC
Value
Units
V
V
V
see Waveform
100K
11.0
5.5
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