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参数资料
| 型号： | HMC660LC4B |
| 厂商： | HITTITE MICROWAVE CORP |
| 元件分类： | 放大器 |
| 英文描述： | 20 MHz - 4500 MHz RF/MICROWAVE WIDE BAND LOW POWER AMPLIFIER |
| 封装： | 4 X 4 MM, ROHS COMPLIANT, SMT, 24 PIN |
| 文件页数： | 21/22页 |
| 文件大小： | 763K |
| 代理商： | HMC660LC4B |
For price, delivery, and to place orders, please contact Hittite Microwave Corporation:
20 Alpha Road, Chelmsford, MA 01824 Phone: 978-250-3343 Fax: 978-250-3373
Order On-line at www.hittite.com
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6 - 9
0.02 - 4.5 GHz WIDEBAND,
3 GS/s TRACK-AND-HOLD AMPLIFIER
v02.1208
Aperture Delay: The delay of the exact sample time relative to the time that the hold command is applied to the
device. It is the difference between the delay of the clock switching transition to the hold node and the input signal
group delay to the hold node. If the input signal group delay to the hold node exceeds the clock delay this quantity
can be negative.
Aperture Jitter: The standard deviation of the sample instant in time.
Acquisition Time: The interval between the internal hold-to-track transition and the time at which the hold-node
signal is tracking the input signal within a specified accuracy. It does not include the pipeline delay of the clock
buffer.
Differential Pedestal: An error term in the sample value caused by charge redistribution in the T/H switch during
the sampling transition. In general, the pedestal can consist of three components: a fixed offset, a component that is
linearly related to input signal amplitude, and a component that is nonlinearly related to input signal amplitude. The
majority of the pedestal is usually linear. A small nonlinear component can cause sampling nonlinearity.
Differential Droop Rate: The slow drift in the differential output voltage of a held sample while the T/H is in hold-
mode. It is typically caused by current leakage on the hold capacitors and corresponds to a decay in the held voltage
with increasing time. The majority of the voltage droop over a given time is usually linearly related to the held sample
voltage and is expressed as a percentage of initial amplitude per unit time. Since it is mostly linear, the droop causes
little nonlinearity.
Feedthrough Rejection: A measure of the off-state (hold-mode) isolation of the T/H’s internal switch. It is defined
as the ratio of the amplitude of the output signal (for a sinusoidal input) feeding through during the hold mode to
the amplitude of the output signal during track mode. Normalization by the track-mode signal gives the true switch
isolation without the effects of the output amplifier bandwidth limiting.
Full Scale Range: The voltage range between the minimum and maximum signal levels that can be handled by the
T/H while still meeting the specifications.
Gain Flatness: The deviation in gain over a specified input band relative to a specified mid-frequency gain.
Sampling Bandwidth: The -3 dB bandwidth of the sampled signal levels represented by the held sample amplitudes.
It includes both the bandwidth of the transfer function from the signal input to the hold-node and any band-limiting
effects associated with the finite time duration of the sampling aperture.
Settling Time: The interval between the internal track-hold transition and the time at which the held output signal is
settled to within a specified accuracy. It does not include the pipeline delay of the clock buffer.
Spurious Free Dynamic Range (SFDR): The ratio (usually expressed in dB) between the sinusoidal output signal
amplitude and the amplitude of the largest non-linearity product falling within one Nyquist bandwidth. It may be
specified for both full scale input and some fraction(s) of full scale input. A SFDR based only on 2nd order nonlinear
products is referred to as the 2nd order SFDR (SFDR2). A SFDR based only on 3rd order products is referred to as the
3rd order SFDR (SFDR3).
Total Harmonic Distortion (THD): The ratio of the total power in the non-linearity-generated harmonics and harmonic
aliases (measured in one Nyquist band) to the output signal power.
HMC660LC4B
Definition of Specifications
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