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| 型号： | ICS950410YF-T |
| 元件分类： | 时钟产生/分配 |
| 英文描述： | 300 MHz, PROC SPECIFIC CLOCK GENERATOR, PDSO48 |
| 封装： | 0.300 INCH, MO-118, SSOP-48 |
| 文件页数： | 4/16页 |
| 文件大小： | 210K |
| 代理商： | ICS950410YF-T |
12
ICS950410
Preliminary Product Preview
0888A—04/22/05
Electrical Characteristics - CPUCLKK8T/C K8 3.3V Push Pull Differential Pair
PARAMETER
SYMBOL
CONDITIONS*
MIN
TYP
MAX
UNITS
NOTES
Rising Edge Rate
δV/δt
2
10
V/ns
1
Falling Edge Rate
δV/δt
2
10
V/ns
1
Differential Voltage
V
DIFF
0.4
2.3
V
1
Change in V
DIFF_DC Magnitude
V
DIFF
-150
150
mV
1
Common Mode Voltage
V
CM
1.05
1.45
V
1
Change in Common Mode
Voltage
V
CM
-200
200
mV
1
Jitter, Cycle to cycle
t
jcyc-cyc
Measurement from differential
wavefrom
0
200
ps
1
Jitter, Accumulated
t
ja
-1000
1000
1,2,3
Duty Cycle
d
t3
Measurement from differential
wavefrom
45
55
%
1
Output Impedance
R
ON
Average value during switching
transition. Used for determining
series termination value.
15
55
1
Group Skew
t
skew
Measurement from differential
wavefrom
250
ps
1
*TA = 0 - 70°C; Supply Voltage VDD = 3.3 V +/-5%
1Guaranteed by design and characterization, not 100% tested in production.
2 All accumulated jitter specifications are guaranteed assuming that REF is at 14.31818MHz
3 Spread Spectrum is off
At CPU's test load. 0 V +/- 400
mV (diffential measurment)
At CPU's test load. (single-
ended measurement)
Electrical Characteristics - HTTCLK
PARAMETER
SYMBOL
CONDITIONS*
MIN
TYP
MAX
UNITS
NOTES
Output Impedance
Z
O
V
O = VX
12
55
1
Output High Voltage
V
OH1
I
OH = -1 mA
2.4
V
1
Output Low Voltage
V
OL1
I
OL = 1 mA
0.4
V
1
Output High Current
I
OH1
V
OH = 2.0 V
-15
mA
1
Output Low Current
I
OL1
V
OL = 0.8 V
10
mA
1
Edge Rate
t
slewr/f
Rise/Fall edge rate between
20% 60%
14
V/ns
1
Rise Time
t
r
V
OL = 0.4 V, VOH = 2.4 V
0.5
2
ns
1
Fall Time
t
f
V
OH = 2.4 V, VOL = 0.4 V
0.5
2
ns
1
Duty Cycle
d
t1
V
T = 50%
45
55
%
1
Group Skew
t
skew
V
T = 1.5 V
150
ps
1
Jitter, Cycle-to-cycle
t
jcyc-cyc2B
V
T = 1.5 V
250
ps
1
*TA = 0 - 70°C; Supply Voltage VDD = 3.3 V +/-5%
1Guaranteed by design and characterization, not 100% tested in production.
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