参数资料
型号: IDT7005L15PF8
厂商: IDT, Integrated Device Technology Inc
文件页数: 5/21页
文件大小: 0K
描述: IC SRAM 64KBIT 15NS 64TQFP
标准包装: 750
格式 - 存储器: RAM
存储器类型: SRAM - 双端口,异步
存储容量: 64K (8K x 8)
速度: 15ns
接口: 并联
电源电压: 4.5 V ~ 5.5 V
工作温度: 0°C ~ 70°C
封装/外壳: 64-LQFP
供应商设备封装: 64-TQFP(14x14)
包装: 带卷 (TR)
其它名称: 7005L15PF8
IDT7005S/L
High-Speed 8K x 8 Dual-Port Static RAM
Military, Industrial and Commercial Temperature Ranges
DC Electrical Characteristics Over the 0perating
Temperature and Supply Voltage Range (V CC = 5.0V ± 10%)
7005S
7005L
Symbol
|I LI |
|I LO |
V OL
V OH
Parameter
Input Leakage Current (1)
Output Leakage Current
Output Low Voltage
Output High Voltage
Test Conditions
V CC = 5.5V, V IN = 0V to V CC
CE = V IH , V OUT = 0V to V CC
I OL = +4mA
I OH = -4mA
Min.
___
___
___
2.4
Max.
10
10
0.4
___
Min.
___
___
___
2.4
Max.
5
5
0.4
___
Unit
μA
μA
V
V
NOTE:
1. At Vcc < 2.0V input leakages are undefined.
Data Retention Characteristics Over All Temperature Ranges
(L Version Only) (V LC = 0.2V, V HC = V CC - 0.2V)
2738 tbl 08
Symbol
V DR
Parameter
V CC for Data Retention
V CC = 2V
Test Condition
Min.
2.0
Typ. (1)
___
Max.
___
Unit
V
I CCDR
Data Retention Current
CE > V HC
Mil. & Ind.
___
100
4000
μA
V IN > V HC or < V LC
Com'l.
___
100
1500
t CDR (3)
t R (3)
Chip Deselect to Data Retention Time
Operation Recovery Time
SEM > V HC
0
t RC (2)
___
___
___
___
ns
ns
NOTES:
1. T A = +25°C, V CC = 2V, and are not production tested.
2. t RC = Read Cycle Time
3. This parameter is guaranteed by characterization, but is not production tested.
Data Retention Waveform
DATA RETENTION MODE
2738 tbl 09
V CC
4.5V
t CDR
V DR > 2V
4.5V
t R
V DR
CE
V IH
5
6.42
V IH
2738 drw 05
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