参数资料
型号: IDT70V27L15PF8
厂商: IDT, Integrated Device Technology Inc
文件页数: 13/21页
文件大小: 0K
描述: IC SRAM 512KBIT 15NS 100TQFP
标准包装: 750
格式 - 存储器: RAM
存储器类型: SRAM - 双端口,异步
存储容量: 512K (32K x 16)
速度: 15ns
接口: 并联
电源电压: 3 V ~ 3.6 V
工作温度: 0°C ~ 70°C
封装/外壳: 100-LQFP
供应商设备封装: 100-TQFP(14x14)
包装: 带卷 (TR)
其它名称: 70V27L15PF8
IDT 70V27S/L
High-Speed 3.3V 32K x 16 Dual-Port Static RAM
Commercial and Industrial Temperature Range
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage Range (6)
70V27X15
Com'l Only
70V27X20
Com'l & Ind
70V27X25
Com'l Only
Symbol
Parameter
Min.
Max.
Min.
Max.
Min.
Max.
Unit
BUSY TIMING (M/ S =V IH )
t BAA
t BDA
t BAC
t BDC
BUSY Access Time from Address Match
BUSY Disable Time from Address Not Matched
BUSY Access Time from Chip Enable Low
BUSY Disable Time from Chip Enable High
____
____
____
____
15
15
15
15
____
____
____
____
20
20
20
20
____
____
____
____
25
25
25
25
ns
ns
ns
ns
t APS
Arbitration Priority Set-up Time
(2)
5
____
5
____
5
____
ns
t BDD
t WH
BUSY Disable to Valid Data
Write Hold After BUSY (5)
(3)
____
12
17
____
____
15
35
____
____
20
35
____
ns
ns
BUSY TIMING (M/ S =V IL )
Write Hold After BUSY
t WB
t WH
BUSY Input to Write (4)
(5)
0
12
____
____
0
15
____
____
0
20
____
____
ns
ns
PORT-TO-PORT DELAY TIMING
t WDD
t DDD
Write Pulse to Data Delay (1)
Write Data Valid to Read Data Delay (1)
____
____
30
25
____
____
45
30
____
____
55
50
ns
ns
3603 tbl 14a
70V27X35
Com'l & Ind
70V27X55
Com'l Only
Symbol
Parameter
Min.
Max.
Min.
Max.
Unit
BUSY TIMING (M/ S =V IH )
t BAA
t BDA
t BAC
t BDC
t APS
t BDD
t WH
BUSY Access Time from Address Match
BUSY Disable Time from Address Not Matched
BUSY Access Time from Chip Enable Low
BUSY Disable Time from Chip Enable High
Arbitration Priority Set-up Time (2)
BUSY Disable to Valid Data (3)
Write Hold After BUSY (5)
____
____
____
____
5
____
25
35
35
35
35
____
40
____
____
____
____
____
5
____
25
45
45
45
45
____
50
____
ns
ns
ns
ns
ns
ns
ns
BUSY TIMING (M/ S =V IL )
t WB
t WH
BUSY Input to Write (4)
Write Hold After BUSY (5)
0
25
____
____
0
25
____
____
ns
ns
PORT-TO-PORT DELAY TIMING
t WDD
t DDD
Write Pulse to Data Delay (1)
Write Data Valid to Read Data Delay (1)
____
____
65
60
____
____
85
80
ns
ns
NOTES:
3603 tbl 14b
1. Port-to-port delay through RAM cells from writing port to reading port, refer to "Timing Waveform of Write with Port-to-Port Read and BUSY (M/ S = V IH )".
2. To ensure that the earlier of the two ports wins.
3. t BDD is a calculated parameter and is the greater of 0, t WDD – t WP (actual), or t DDD – t DW (actual).
4. To ensure that the write cycle is inhibited on port "B" during contention on port "A".
5. To ensure that a write cycle is completed on port "B" after contention on port "A".
6. 'X' in part numbers indicates power rating (S or L).
13
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