参数资料
型号: IDT70V3599S133BF8
厂商: IDT, Integrated Device Technology Inc
文件页数: 7/23页
文件大小: 0K
描述: IC SRAM 4MBIT 133MHZ 208FBGA
标准包装: 1,000
格式 - 存储器: RAM
存储器类型: SRAM - 双端口,同步
存储容量: 4.5M(128K x 36)
速度: 133MHz
接口: 并联
电源电压: 3.15 V ~ 3.45 V
工作温度: 0°C ~ 70°C
封装/外壳: 208-LFBGA
供应商设备封装: 208-CABGA(15x15)
包装: 带卷 (TR)
其它名称: 70V3599S133BF8
IDT70V3599/89S
High-Speed 3.3V 128/64K x 36 Dual-Port Synchronous Static RAM
Recommended Operating
Temperature and Supply Voltage (1)
Industrial and Commercial Temperature Ranges
Recommended DC Operating
Conditions with V DDQ at 2.5V
Ambient
Symbol
Parameter
Min.
Typ.
Max.
Unit
Grade
Temperature
GND
V DD
V DD
Core Supply Voltage
3.15
3.3
3.45
V
Commercial
Industrial
0 O C to +70 O C
-40 O C to +85 O C
0V
0V
3.3V + 150mV
3.3V + 150mV
V DDQ
V SS
I/O Supply Voltage
Ground
(3)
2.4
0
2.5
0
2.6
0
V
V
NOTES:
5617 tbl 04
1. This is the parameter TA. This is the "instant on" case temperature.
V IH
Input High Voltage
(Address & Control Inputs)
1.7
____
V DDQ + 100mV
(2)
V
V IH
Input High Voltage - I/O (3)
1.7
____
V DDQ + 100mV (2)
V
V IL
Input Low Voltage
-0.3
(1)
____
0.7
V
NOTES:
5617 tbl 05a
Absolute Maximum Ratings (1)
1. Undershoot of V IL > -1.5V for pulse width less than 10ns is allowed.
2. V TERM must not exceed V DDQ + 100mV.
Symbol
V TERM(2)
Rating
Terminal Voltage
Commercial
& Industrial
-0.5 to +4.6
Unit
V
3. To select operation at 2.5V levels on the I/Os and controls of a given port, the
OPT pin for that port must be set to V IL (0V), and V DDQX for that port must be supplied
as indicated above.
T BIAS(3)
with Respect to GND
Temperature Under Bias
-55 to +125
o
C
Recommended DC Operating
Conditions with V DDQ at 3.3V
T STG
T JN
Storage Temperature
Junction Temperature
-65 to +150
+150
o
o
C
C
Symbol
V DD
Parameter
Core Supply Voltage
Min.
3.15
Typ.
3.3
Max.
3.45
Unit
V
I OUT
DC Output Current
50
mA
V DDQ
I/O Supply Voltage (3)
3.15
3.3
3.45
V
5617 tbl 06
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and functional
V SS
V IH
Ground
Input High Voltage
(Address & Control Inputs) (3)
0
2.0
0
____
0
V DDQ + 150mV
(2)
V
V
operation of the device at these or any other conditions above those indicated
in the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
V IH
V IL
Input High Voltage - I/O (3)
Input Low Voltage
2.0
-0.3 (1)
____
____
V DDQ + 150mV (2)
0.8
V
V
2. V TERM must not exceed V DD + 150mV for more than 25% of the cycle time or
4ns maximum, and is limited to < 20mA for the period of V TERM > V DD + 150mV.
NOTES:
5617 tbl 05b
3. Ambient Temperature Under Bias. No AC Conditions. Chip Deselected.
1. Undershoot of V IL > -1.5V for pulse width less than 10ns is allowed.
2. V TERM must not exceed V DDQ + 150mV.
3. To select operation at 3.3V levels on the I/Os and controls of a given port, the
OPT pin for that port must be set to V IH (3.3V), and V DDQX for that port must be
supplied as indicated above.
7
6.42
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