参数资料
型号: IDT70V639S12BC
厂商: IDT, Integrated Device Technology Inc
文件页数: 22/23页
文件大小: 0K
描述: IC SRAM 2.25MBIT 12NS 256BGA
标准包装: 6
格式 - 存储器: RAM
存储器类型: SRAM - 双端口,异步
存储容量: 2.25M(128K x 18)
速度: 12ns
接口: 并联
电源电压: 3.15 V ~ 3.45 V
工作温度: 0°C ~ 70°C
封装/外壳: 256-LBGA
供应商设备封装: 256-CABGA(17x17)
包装: 托盘
其它名称: 70V639S12BC
IDT70V639S
High-Speed 3.3V 128K x 18 Asynchronous Dual-Port Static RAM
Identification Register Definitions
Industrial and Commercial Temperature Ranges
Instruction Field
Revision Number (31:28)
IDT Device ID (27:12)
IDT JEDEC ID (11:1)
ID Register Indicator Bit (Bit 0)
Value
0x0
0x30C
0x33
1
Description
Reserved for version number
Defines IDT part number
Allows unique identification of device vendor as IDT
Indicates the presence of an ID register
5621 tbl 20
Scan Register Sizes
Register Name
Instruction (IR)
Bypass (BYR)
Identification (IDR)
Boundary Scan (BSR)
Bit Size
4
1
32
Note (3)
5621 tbl 21
System Interface Parameters
Instruction
EXTEST
BYPASS
IDCODE
HIGHZ
CLAMP
SAMPLE/PRELOAD
RESERVED
NOTES:
Code
0000
1111
0010
0100
0011
0001
All other codes
Description
Forces contents of the bound ary scan cells onto the device outputs (1) .
Places the boundary scan register (BSR) between TDI and TDO.
Places the bypass registe r (BYR) between TDI and TDO.
Loads the ID register (IDR) with the vendor ID code and places the
register between TDI and TDO.
Places the bypass register (BYR) between TDI and TDO. Forces all
device output drivers to a High-Z state.
Uses BYR. Forces contents of the boundary scan cells onto the device
outputs. Places the bypass registe r (BYR) between TDI and TDO.
Places the boundary scan register (BSR) between TDI and TDO.
SAMPLE allows data from device inputs (2) and outputs (1) to be captured
in the boundary scan cells and shifted serially through TDO. PRELOAD
allows data to be input serially into the boundary scan cells via the TDI.
Several combinations are reserved. Do not use codes other than those
identified above.
5621 tbl 22
1. Device outputs = All device outputs except TDO.
2. Device inputs = All device inputs except TDI, TMS, and TRST .
3. The Boundary Scan Descriptive Language (BSDL) file for this device is available on the IDT website (www.idt.com), or by contacting your local
IDT sales representative.
22
相关PDF资料
PDF描述
IDT70V658S12BF IC SRAM 2MBIT 12NS 208FBGA
IDT70V639S12BF IC SRAM 2.25MBIT 12NS 208FBGA
IDT7008S25G IC SRAM 512KBIT 25NS 84PGA
MPC8541PXAJD IC MPU POWERQUICC III 783-FCPBGA
IDT70T3399S133BCI IC SRAM 2MBIT 133MHZ 256BGA
相关代理商/技术参数
参数描述
IDT70V639S12BC8 功能描述:IC SRAM 2.25MBIT 12NS 256BGA RoHS:否 类别:集成电路 (IC) >> 存储器 系列:- 标准包装:3,000 系列:- 格式 - 存储器:EEPROMs - 串行 存储器类型:EEPROM 存储容量:8K (1K x 8) 速度:400kHz 接口:I²C,2 线串口 电源电压:1.7 V ~ 5.5 V 工作温度:-40°C ~ 85°C 封装/外壳:8-SOIC(0.154",3.90mm 宽) 供应商设备封装:8-SOIC 包装:带卷 (TR)
IDT70V639S12BCI 功能描述:IC SRAM 2.25MBIT 12NS 256BGA RoHS:否 类别:集成电路 (IC) >> 存储器 系列:- 标准包装:3,000 系列:- 格式 - 存储器:EEPROMs - 串行 存储器类型:EEPROM 存储容量:8K (1K x 8) 速度:400kHz 接口:I²C,2 线串口 电源电压:1.7 V ~ 5.5 V 工作温度:-40°C ~ 85°C 封装/外壳:8-SOIC(0.154",3.90mm 宽) 供应商设备封装:8-SOIC 包装:带卷 (TR)
IDT70V639S12BCI8 功能描述:IC SRAM 2.25MBIT 12NS 256BGA RoHS:否 类别:集成电路 (IC) >> 存储器 系列:- 标准包装:3,000 系列:- 格式 - 存储器:EEPROMs - 串行 存储器类型:EEPROM 存储容量:8K (1K x 8) 速度:400kHz 接口:I²C,2 线串口 电源电压:1.7 V ~ 5.5 V 工作温度:-40°C ~ 85°C 封装/外壳:8-SOIC(0.154",3.90mm 宽) 供应商设备封装:8-SOIC 包装:带卷 (TR)
IDT70V639S12BF 功能描述:IC SRAM 2.25MBIT 12NS 208FBGA RoHS:否 类别:集成电路 (IC) >> 存储器 系列:- 标准包装:3,000 系列:- 格式 - 存储器:EEPROMs - 串行 存储器类型:EEPROM 存储容量:8K (1K x 8) 速度:400kHz 接口:I²C,2 线串口 电源电压:1.7 V ~ 5.5 V 工作温度:-40°C ~ 85°C 封装/外壳:8-SOIC(0.154",3.90mm 宽) 供应商设备封装:8-SOIC 包装:带卷 (TR)
IDT70V639S12BF8 功能描述:IC SRAM 2.25MBIT 12NS 208FBGA RoHS:否 类别:集成电路 (IC) >> 存储器 系列:- 标准包装:3,000 系列:- 格式 - 存储器:EEPROMs - 串行 存储器类型:EEPROM 存储容量:8K (1K x 8) 速度:400kHz 接口:I²C,2 线串口 电源电压:1.7 V ~ 5.5 V 工作温度:-40°C ~ 85°C 封装/外壳:8-SOIC(0.154",3.90mm 宽) 供应商设备封装:8-SOIC 包装:带卷 (TR)