参数资料
型号: IDT82V3001A
厂商: Integrated Device Technology, Inc.
英文描述: WAN PLL WITH SINGLE REFERENCE INPUT
中文描述: 广域网锁相环单参考输入
文件页数: 8/27页
文件大小: 345K
代理商: IDT82V3001A
8
IDT82V3001A WAN PLL WITH SINGLE REFERENCE INPUT INDUSTRIAL TEMPERATURE RANGE
C16o
(CMOS) O
24
Clock 16.384 MHz.
This output is a 16.384 MHz clock used for ST-BUS operation.
C8o
(CMOS) O
23
Clock 8.192 MHz.
This output is an 8.192 MHz clock used for ST-BUS operation.
C4o
(CMOS) O
20
Clock 4.096 MHz.
This output is a 4.096 MHz clock used for ST-BUS operation.
C2o
(CMOS) O
17
Clock 2.048 MHz.
This output is a 2.048 MHz clock used for ST-BUS operation.
C3o
(CMOS) O
16
Clock 3.088 MHz.
This output is a 3.088 MHz clock used for T1 applications.
C1.5o
(CMOS) O
15
Clock 1.544 MHz.
This output is a 1.544 MHz clock used for T1 applications.
C6o
(CMOS) O
14
Clock 6.312 MHz.
This output is a 6.312 MHz clock used for DS2 applications.
F32o
(CMOS) O
40
Frame Pulse ST-BUS 8.192 Mb/s.
This is an 8 kHz 31 ns active low framing pulse, which marks the beginning of an ST-BUS frame. This is typically used for
ST-BUS operation at 8.192 Mb/s.
F16o
(CMOS) O
39
Frame Pulse ST-BUS 8.192 Mb/s.
This is an 8 kHz 61 ns active low framing pulse, which marks the beginning of an ST-BUS frame. This is typically used for
ST-BUS operation at 8.192 Mb/s.
F8o
(CMOS) O
36
Frame Pulse.
This is an 8 kHz 122 ns active high framing pulse, which marks the beginning of a frame.
F0o
(CMOS) O
33
Frame Pulse ST-BUS 2.048 Mb/s.
This is an 8 kHz 244 ns active low framing pulse, which marks the beginning of an ST-BUS frame. This is typically used
for ST-BUS operation at 2.048 Mb/s and 4.096 Mb/s.
RSP
(CMOS) O
41
Receive Sync Pulse.
This is an 8 kHz 488 ns active high framing pulse, which marks the beginning of an ST-BUS frame. This is typically used
to connect to Siemens MUNICH-32 device.
TSP
(CMOS) O
42
Transmit Sync Pulse.
This is an 8 kHz 488 ns active high framing pulse, which marks the beginning of an ST-BUS frame. This is typically used
to connect to Siemens MUNICH-32 device.
TDO
(CMOS) O
29
Test Serial Data Out.
JTAG serial data is output on this pin on the falling edge of TCK. This pin is held in high impedance state if JTAG scan is
not enabled.
TDI
I
32
Test Serial Data In.
JTAG serial test instructions and data are shifted in on this pin. This pin is internally pulled up to V
DD
.
TRST
I
30
Test Reset.
Asynchronously initializes the JTAG TAP controller by putting it in Test-Logic-Reset state. This pin is internally pulled up
to V
DD
. It is connected to the ground for normal applications.
TCK
I
28
Test Clock.
Provides a clock to JTAG test logic.
TMS
I
31
Test Mode Select.
JTAG signal that controls the state transitions of the TAP controller. This pin is internally pulled up to V
DD
.
IC0, IC1, IC2
-
53, 54, 55Internal Connection.
SS
when in normal operation.
Table - 1 Pin Description (Continued)
Name
Type
Pin
Number
Description
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