参数资料
型号: IG80C286-10
厂商: HARRIS SEMICONDUCTOR
元件分类: 微控制器/微处理器
英文描述: High Performance Microprocessor with Memory Management and Protection
中文描述: 16-BIT, 10 MHz, MICROPROCESSOR, CPGA68
文件页数: 3/13页
文件大小: 365K
代理商: IG80C286-10
3-130
80C286/883
Absolute Maximum Ratings
Thermal Information
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+8.0V
Input, Output or I/O Voltage Applied. . . . . .GND -1.0V to V
CC
+1.0V
Storage Temperature Range . . . . . . . . . . . . . . . . . -65
o
C to +150
o
C
Junction Temperature. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175
o
C
Lead Temperature (Soldering 10s). . . . . . . . . . . . . . . . . . . . +300
o
C
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Thermal Resistance (Typical)
PGA Package . . . . . . . . . . . . . . . . . . . . .
Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22,500 Gates
θ
JA
θ
JC
6
o
C/W
35
o
C/W
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1.
θ
JA
is measured with the component mounted on an evaluation PC board in free air.
Operating Conditions
Operating Voltage Range . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Operating Temperature Range. . . . . . . . . . . . . . . . -55
o
C to +125
o
C
System Clock (CLK) RISE Time (From 1.0V to 3.6V . . . . 8ns (Max)
System Clock (CLK) FALL Time (from 3.6V to 1.0V) . . . . 8ns (Max)
Input RISE and FALL Time (From 0.8V to 2.0V
80C286-10/883 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10ns (Max)
80C286-12/883 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8ns (Max)
TABLE 1. 80C286/883 D.C. ELECTRICAL PERFORMANCE SPECIFICATIONS
Device Guaranteed and 100% Tested
PARAMETER
SYMBOL
CONDITIONS
GROUP A
SUB-
GROUPS
TEMPERATURE
LIMITS
UNITS
MIN
MAX
Input LOW Voltage
V
IL
V
CC
= 4.5V
1, 2, 3
-55
o
C
T
A
+125
o
C
-55
o
C
T
A
+125
o
C
-55
o
C
T
A
+125
o
C
-55
o
C
T
A
+125
o
C
-55
o
C
T
A
+125
o
C
-55
o
C
T
A
+125
o
C
-0.5
0.8
V
Input HIGH Voltage
V
IH
V
CC
= 5.5V
1, 2, 3
2.0
V
CC
+0.5
V
CLK Input LOW Voltage
V
ILC
V
CC
= 4.5V
1, 2, 3
-0.5
1.0
V
CLK Input HIGH Voltage
V
IHC
V
CC
= 5.5V
1, 2, 3
3.6
V
CC
+0.5
V
Output LOW Voltage
V
OL
I
OL
= 2.0mA, V
CC
= 4.5V
1, 2, 3
-
0.4
V
Output HIGH Voltage
V
OH
I
OH
= -2.0mA, V
CC
= 4.5V
I
OH
= -100
μ
A, V
CC
= 4.5V
1, 2, 3
3.0
-
V
V
CC
-0.4
-
V
Input Leakage Current
I
I
V
IN
= GND or V
CC
,
V
CC
= 5.5V,
Pins 29, 31, 57, 59, 61,
63-64
1, 2, 3
-55
o
C
T
A
+125
o
C
-10
10
μ
A
Input Sustaining Current
LOW
I
BHL
V
CC
= 4.5V and 5.5V,
V
IN
= 1.0V, Note 1
1, 2, 3
-55
o
C
T
A
+125
o
C
38
200
μ
A
Input Sustaining Current
HIGH
I
BHH
V
CC
= 4.5V and 5.5V,
V
IN
= 3.0V, Note 2
1, 2, 3
-55
o
C
T
A
+125
o
C
-50
-400
μ
A
Input Sustaining Current
on BUSY and ERROR
Pins
I
SH
V
CC
= 4.5V and 5.5V
V
IN
= GND, Note 5
1, 2, 3
-55
o
C
T
A
+125
o
C
-30
-500
μ
A
Output Leakage Current
I
O
V
O
= GND or V
CC
V
CC
= 5.5V,
Pins 1, 7-8, 10-28, 32-34
1, 2, 3
-55
o
C
T
A
+125
o
C
-10
10
μ
A
Active Power Supply
Current
I
CCOP
80C286-10/883, Note 4
1, 2, 3
-55
o
C
T
A
+125
o
C
-
185
mA
80C286-12/883, Note 4
-
220
mA
Standby Power
Supply Current
I
CCSB
V
CC
= 5.5V, Note 3
1, 2, 3
-55
o
C
T
A
+125
o
C
-
5
mA
NOTES:
2. I
BHL
should be measured after lowering V
IN
to GND and then raising to 1.0V on the following pins: 36-51, 66, 67.
3. I
BHH
should be measured after raising V
IN
to V
CC
and then lowering to 3.0V on the following pins: 4-6, 36-51, 66-68.
4. I
CCSB
should be tested with the clock stopped in phase two of the processor clock cycle. V
IN
= V
CC
or GND, V
CC
= 5.5V, outputs unloaded.
5. I
CCOP
measured at 10MHz for the 80C286-10/883 and 12.5MHz for the 80C286-12/883. V
IN
= 2.4V or 0.4V, V
CC
= 5.5V, outputsunloaded.
6. I
SH
should be measured after raising V
IN
to V
CC
and then lowering to 0V on pins 53 and 54.
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