参数资料
型号: IRHM54160
厂商: International Rectifier
英文描述: 100V, N-Channel Thru-hole Radiation Hardened Power MOSFET(100V,通孔安装抗辐射功率N沟道MOSFET)
中文描述: 100V的N通道通孔抗辐射功率MOSFET(100V的,通孔安装抗辐射功率?沟道MOSFET的)
文件页数: 3/8页
文件大小: 108K
代理商: IRHM54160
www.irf.com
3
Radiation Characteristics
IRHM57160
Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation
Parameter
Up to 600K Rads(Si)
1
1000K Rads (Si)
2
Units
Test Conditions
Min Max Min Max
BV
DSS
Drain-to-Source Breakdown Voltage 100 — 100 — V V
GS
= 0V, I
D
= 1.0mA
V
GS(th)
Gate Threshold Voltage
2.0 4.0 1.5 4.0
I
GSS
Gate-to-Source Leakage Forward
— 100 — 100 nA
I
GSS
Gate-to-Source Leakage Reverse
— -100 — -100
I
DSS
Zero Gate Voltage Drain Current
— 10 — 10 μA
R
DS(on)
Static Drain-to-Source
— 0.013 — 0.014
V
GS
= 12V, I
D
=35A
On-State Resistance (TO-3)
R
DS(on)
Static Drain-to-Source
— 0.018 — 0.019
V
GS
= 12V, I
D
=35A
On-State Resistance (TO-254)
V
SD
Diode Forward Voltage
— 1.2 — 1.2 V
V
GS
= V
DS
, I
D
= 1.0mA
V
GS
= 20V
V
GS
= -20 V
V
DS
= 80V, V
GS
=0V
International Rectifier Radiation Hardened MOSFETs are tested to verify their radiation hardness capability.
The hardness assurance program at International Rectifier is comprised of two radiation environments.
Every manufacturing lot is tested for total ionizing dose (per notes 5 and 6) using the TO-3 package. Both
pre- and post-irradiation performance are tested and specified using the same drive circuitry and test
conditions in order to provide a direct comparison.
1. Part numbers IRHM57160, IRHM53160 and IRHM54160
2. Part number IRHM58160
Fig a.
Single Event Effect, Safe Operating Area
V
GS
= 0V, IS = 35A
International Rectifier radiation hardened MOSFETs have been characterized in heavy ion environment for
Single Event Effects (SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2.
For footnotes refer to the last page
Table 2. Single Event Effect Safe Operating Area
Ion
MeV/(mg/cm
2
)) (MeV) (μm)
@V
=0V @V
=-5V @V
=-10V @V
=-15V @V
=-20V
Br
36.7
309 39.5 100 100 100 100 100
I
59.8
341 32.5 100 100 100 35 25
Au
82.3
350 28.4 100 100 80
LET
Energy Range
V
DS
(V)
25
0
20
40
60
80
100
120
-20
-15
-10
-5
0
VDS
V
Br
I
Au
相关PDF资料
PDF描述
IRHM57160 100V, N-Channel Thru-hole Radiation Hardened Power MOSFET(100V,通孔安装抗辐射功率N沟道MOSFET)
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