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参数资料
| 型号： | IRHNB7264SE |
| 英文描述： | TRANSISTOR | MOSFET | N-CHANNEL | 250V V(BR)DSS | 34A I(D) | SMT |
| 中文描述： | 晶体管| MOSFET的| N沟道| 250V五（巴西）直| 34A条（丁）|贴片 |
| 文件页数： | 3/8页 |
| 文件大小： | 116K |
| 代理商： | IRHNB7264SE |
www.irf.com
3
Radiation Characteristics
IRHNB7260
Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation
Parameter
Min Max Min Max
BV
DSS
Drain-to-Source Breakdown Voltage 200 — 200 — V V
GS
= 0V, I
D
= 1.0mA
V
GS(th)
Gate Threshold Voltage
2.0 4.0 1.25 4.5
I
GSS
Gate-to-Source Leakage Forward
— 100 — 100 nA
I
GSS
Gate-to-Source Leakage Reverse
— -100 — -100
I
DSS
Zero Gate Voltage Drain Current
— 25 — 50 μA V
DS
=160V, V
GS
=0V
R
DS(on)
Static Drain-to-Source
— 0.070 — 0.110
V
GS
= 12V, I
D
=27A
On-State Resistance (TO-3)
R
DS(on)
Static Drain-to-Source
— 0.070 — 0.110
V
GS
= 12V, I
D
=27A
On-State Resistance (SMD-3)
V
SD
Diode Forward Voltage
— 1.8 — 1.8 V
100K Rads (Si)
1
300 - 1000K Rads (Si)
2
Units
Test Conditions
V
GS
= V
DS
, I
D
= 1.0mA
V
GS
= 20V
V
GS
= -20 V
International Rectifier Radiation Hardened MOSFETs are tested to verify their radiation hardness capability.
The hardness assurance program at International Rectifier is comprised of two radiation environments.
Every manufacturing lot is tested for total ionizing dose (per notes 5 and 6) using the TO-3 package. Both
pre- and post-irradiation performance are tested and specified using the same drive circuitry and test
conditions in order to provide a direct comparison.
1. Part number IRHNB7260
2. Part numbers IRHNB3260, IRHNB4260 and IRHNB8260
Fig a.
Single Event Effect, Safe Operating Area
V
GS
= 0V, IS = 43A
International Rectifier radiation hardened MOSFETs have been characterized in heavy ion environment for
Single Event Effects (SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2.
For footnotes refer to the last page
Table 2. Single Event Effect Safe Operating Area
0
50
100
150
200
0
-5
-10
-15
-20
VGS
V
Cu
Br
n
o
T
E
m
L
)
2
m
c
(
V
e
M
y
)
g
V
r
e
e
n
M
(
E
e
)
g
n
m
a
μ
(
R
)
V
(
S
D
V
V
0
=
S
G
V
@
V
5
-
=
S
G
V
@
V
0
1
-
=
S
G
V
@
V
5
1
-
=
S
G
V
@
V
0
2
-
=
S
G
V
@
u
C
8
2
5
8
2
3
4
0
9
1
0
8
1
0
7
1
5
2
1
—
r
B
8
3
5
0
3
9
3
0
0
1
0
0
1
0
0
1
0
5
—
相关PDF资料 |
PDF描述 |
|---|---|
| IRHNB7360SE | 400V 100kRad Hi-Rel Single N-Channel SEE Hardened MOSFET in a SMD-3 package |
| IRHNB7Z60 | TRANSISTOR | MOSFET | N-CHANNEL | 30V V(BR)DSS | 75A I(D) | SMT |
| IRHNB8064 | 60V 1000kRad Hi-Rel Single N-Channel TID Hardened MOSFET in a SMD-3 package |
| IRHNB8260 | TRANSISTOR | MOSFET | N-CHANNEL | 200V V(BR)DSS | 43A I(D) |
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相关代理商/技术参数 |
参数描述 |
|---|---|
| IRHNB7360SE | 制造商:IRF 制造商全称:International Rectifier 功能描述:RADIATION HARDENED POWER MOSFET SURFACE MOUNT (SMD-3) |
| IRHNB7460SE | 制造商:International Rectifier 功能描述: |
| IRHNB7Z60 | 制造商:IRF 制造商全称:International Rectifier 功能描述:RADIATION HARDENED POWER MOSFET SURFACE MOUNT(SMD-3) |
| IRHNB8064 | 制造商:International Rectifier 功能描述:HEXFET, HIREL, RAD HARD,G4 - Bulk |
| IRHNB8160 | 制造商:International Rectifier 功能描述:HEXFET, HIREL, RAD HARD,G4 - Bulk |
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