10
FN6261.2
June 5, 2012
AC Test Circuits
Figures
28C and
28D illustrate the optimum output load for
testing AC performance at 500
Ω and 150Ω loads.
Figure
28E illustrates the optimum output load for 50
Ω and
75
Ω cable-driving.
Application Information
General
Key features of the ISL59446 include a fixed gain of 2,
buffered high impedance analog inputs and excellent AC
performance at output loads down to 150
Ω for video
cable-driving. The current feedback output amplifiers are
stable operating into capacitive loads.
For the best isolation and crosstalk rejection, all GND pins
and NIC pins must connect to the GND plane.
AC Design Considerations
High speed current-feed amplifiers are sensitive to
capacitance at the inverting input and output terminals. The
ISL59446 has an internally set gain of 2, so the inverting
input is not accessible. Capacitance at the output terminal
increases gain peaking (Figure
1) and pulse overshoot
(Figures
19 and
20). The AC response of the ISL59446 is
optimized for a total output capacitance of up to 2.1pF over
the load range of 150
Ω to 500Ω. When PCB trace
capacitance and component capacitance exceed 2pF, pulse
overshoot becomes strongly dependent on the input pulse
amplitude and slew rate. This effect is shown in Figures
19and
20, which show approximate pulse overshoot as a
function of input slew rate and output capacitance. Fast
pulse rise and fall times (<150ns) at input amplitudes above
0.2V, cause the input pulse slew rate to exceed the
1600V/s output slew rate of the ISL59446. At 125ps rise
time, pulse input amplitudes >0.2V cause slew rate limit
operation. Increasing levels of output capacitance reduce
stability resulting in increased overshoot, and settling time.
PC board trace length should be kept to a minimum in order
to minimize output capacitance and prevent the need for
controlled impedance lines. At 500MHz trace lengths
approaching 1” begin exhibiting transmission line behavior
and may cause excessive ringing if controlled impedance
traces are not used. Figure
28A shows the optimum
inter-stage circuit when the total output trace length is less
than the critical length of the highest signal frequency.
For applications where pulse response is critical and where
inter-stage distances exceed LCRIT, the circuit shown in
Figure 28B is recommended. Resistor RS constrains the capacitance seen by the amplifier output to the trace
capacitance from the output pin to the resistor. Therefore,
RS should be placed as close to the ISL59446 output pin as
possible. For inter-stage distances much greater than LCRIT,
the back-loaded circuit shown in Figure
28E should be used
with controlled impedance PCB lines, with RS and RL equal
to the controlled impedance.
For applications where inter-stage distances are long, but
pulse response is not critical, capacitor CS can be added to
low values of RS to form a low-pass filter to dampen pulse
overshoot. This approach avoids the need for the large gain
correction required by the -6dB attenuation of the
AC Test Circuits
FIGURE 28A. TEST CIRCUIT WITH OPTIMAL OUTPUT LOAD
FIGURE 28B. INTER-STAGE APPLICATION CIRCUIT
FIGURE 28C. 500
Ω TEST CIRCUIT WITH 50Ω LOAD
FIGURE 28D. 150Ω TEST CIRCUIT WITH 50
Ω LOAD
FIGURE 28E. BACKLOADED TEST CIRCUIT FOR 75
Ω VIDEO
CABLE APPLICATION
ISL59446
*CL
50
Ω
VIN
500
Ω, or
RL
1.1pF
or
75
Ω
150
Ω
*CL Includes PCB trace capacitance
VOUT
LCRIT
x2
ISL59446
CS
50
Ω
VIN
500
Ω, or
RL
or
75
Ω
75
Ω
LCRIT
RS
CL
x2
ISL59446
RS
*CL
VIN
475
Ω
TEST
1.1pF
50
Ω
56.2
Ω
50
Ω
EQUIPMENT
*CL Includes PCB trace capacitance
LCRIT
x2
ISL59446
RS
*CL
VIN
118
Ω
TEST
2.1pF
50
Ω,or
86.6
Ω
50
Ω
EQUIPMENT
75
Ω
*CL Includes PCB trace capacitance
LCRIT
x2
ISL59446
RS
*CL
VIN
50
Ω or 75Ω
TEST
2.1pF
50
Ω
or
75
Ω
50
Ω or 75Ω
EQUIPMENT
*CL Includes PCB trace capacitance
LCRIT
x2
ISL59446