参数资料
型号: KAD2710C-27Q68
厂商: Intersil
文件页数: 5/16页
文件大小: 0K
描述: IC ADC 10BIT 275MSPS PAR 68-QFN
产品培训模块: High-Speed Analog-to-Digital Converters
标准包装: 1
系列: FemtoCharge™
位数: 10
采样率(每秒): 275M
数据接口: 并联
转换器数目: 1
功率耗散(最大): 294mW
电压电源: 单电源
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 68-VFQFN 裸露焊盘
供应商设备封装: 68-QFN(10x10)
包装: 托盘
输入数目和类型: 1 个差分,单极
13
FN6814.0
December 5, 2008
A back-to-back transformer scheme is used to improve
common-mode rejection, which keeps the common-mode
level of the input matched to VCM. The value of the shunt
resistor should be determined based on the desired load
impedance.
The sample and hold circuit design uses a switched
capacitor input stage, which creates current spikes when the
sampling capacitance is reconnected to the input voltage.
This creates a disturbance at the input which must settle
before the next sampling point. Lower source impedance will
result in faster settling and improved performance. Therefore
a 1:1 transformer and low shunt resistance are
recommended for optimal performance.
A differential amplifier can be used in applications that
require dc coupling. In this configuration the amplifier will
typically determine the achievable SNR and distortion. A
typical differential amplifier circuit is shown in Figure 25.
Clock Input
The sample clock input circuit is a differential pair (see
Figure 29). Driving these inputs with a high level (up to
1.8VP-P on each input) sine or square wave will provide the
lowest jitter performance.
The recommended drive circuit is shown in Figure 26. The
clock can be driven single-ended, but this will reduce the
edge rate and may impact SNR performance.
Use of the clock divider is optional. The KAD2710C's ADC
requires a clock with 50% duty cycle for optimum
performance. If such a clock is not available, one option is to
generate twice the desired sampling rate and use the
KAD2710C's divide-by-2 setting. This frequency divider uses
the rising edge of the clock, so 50% clock duty cycle is
assured. Table 2 describes the CLKDIV connection.
CLKDIV is internally pulled low, so a pull-up resistor or logic
driver must be connected for undivided clock.
Jitter
In a sampled data system, clock jitter directly impacts the
achievable SNR performance. The theoretical relationship
between clock jitter (tJ) and SNR is shown in Equation 1 and
is illustrated in Figure 27.
Where tJ is the RMS uncertainty in the sampling instant.
FIGURE 23. TRANSFORMER INPUT FOR GENERAL
APPLICATIONS
ADT1-1WT
0.1F
KAD2710
VCM
50
O
0.01F
Analog
In
ADT1-1WT
Ω
ADTL1-12
0.1F
KAD2710
VCM
ADTL1-12
1nF
Analog
Input
FIGURE 24. TRANSMISSION-LINE TRANSFORMER INPUT
FOR HIGH IF APPLICATIONS
KAD2710
VCM
0.1F
0.22F
69.8O
49.9O
100O
69.8O
348O
CM
217O
25O
Analog
Input
FIGURE 25. DIFFERENTIAL AMPLIFIER INPUT
Ω
TABLE 2. CLKDIV PIN SETTINGS
CLKDIV PIN
DIVIDE RATIO
AVSS
2
AVDD
1
TC4-1W
1nF
AVDD2
200O
CLKP
CLKN
1kO
1nF
Clock
Input
FIGURE 26. RECOMMENDED CLOCK DRIVE
Ω
SNR
20 log
10
1
2
πf
IN tJ
--------------------
=
(EQ. 1)
tj=100p s
tj=10p s
tj=1ps
tj=0.1p s
10 Bits
12 Bits
14 Bits
50
55
60
65
70
75
80
85
90
95
100
1
10
100
1000
Input Frequency - MHz
SN
R-
d
B
FIGURE 27. SNR vs CLOCK JITTER
KAD2710C
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