参数资料
型号: LM199H-SMD
厂商: NATIONAL SEMICONDUCTOR CORP
元件分类: 基准电压源/电流源
英文描述: 1-OUTPUT TWO TERM VOLTAGE REFERENCE, 6.95 V, MBCY4
封装: METAL CAN, BCY-4
文件页数: 1/4页
文件大小: 14K
代理商: LM199H-SMD
Original Creation Date: 08/15/95
Last Update Date: 02/24/03
Last Major Revision Date: 08/15/95
MNLM199-X REV 0CL
MICROCIRCUIT DATA SHEET
PRECISION VOLTAGE REFERENCE
General Description
The LM199 are precision, temperature-stabilized monolithic zeners offering temperature
coefficients a factor of ten better than high quality reference zener. Constructed on a
single monolithic chip is a temperature stabilizer circuit and an active reference zener.
The active circuitry reduces the dynamic impedance of the zener to about 0.5 ohms and
allows the zener to operate over 0.5 mA to 10 mA current range with essentially no change
in voltage or temperature coefficient. Further, a new subsurface zener structure gives low
noise and excellent long term stability compared to ordinary mono lithic zeners. The
package is supplied with a thermal shield to minimize heater power and improve temperature
regulation.
The LM199 references are exceptionally easy to use and free of the problems that are often
experienced with ordinary zeners. There is virtually no hysteresis in reference voltage
with temperature cycling. Also, the LM199 is free of voltage shift due to stress on the
leads. Finally, since the unit is temperature stabilized, warm up time is fast.
The LM199 can be used in almost any application in place of ordinary zeners with improved
performance. Some ideal applications are analog to digital converters, calibration
standards, precision voltage or current sources or precision power supplies. Further in
many cases the LM199 can replace references in existing equipment with a minimum of wiring
changes.
The LM199 devices are packaged in a standard hermetic T0-46 package inside a thermal
shield. The LM199 is rated for operation from -55 C to +125 C.
NS Part Numbers
LM199H-SMD*
LM199H/883
Industry Part Number
LM199
Prime Die
LM199
Controlling Document
5962-8856102XA*
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
1
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