参数资料
| 型号： | LTC1747IFW#PBF |
| 厂商： | Linear Technology |
| 文件页数： | 4/20页 |
| 文件大小： | 0K |
| 描述： | IC ADC 12BIT 80MSPS 48-TSSOP |
| 标准包装： | 39 |
| 位数： | 12 |
| 采样率（每秒）： | 80M |
| 数据接口： | 并联 |
| 转换器数目： | 1 |
| 功率耗散（最大）： | 1.55W |
| 电压电源： | 单电源 |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 48-TFSOP（0.240"，6.10mm 宽） |
| 供应商设备封装： | 48-TSSOP |
| 包装： | 管件 |
| 输入数目和类型： | 2 个单端，双极；1 个差分，双极 |
12
LTC1747
1747fa
In operation, the ADC quantizes the input to the stage and
the quantized value is subtracted from the input by the
DAC to produce a residue. The residue is amplified and
output by the residue amplifier. Successive stages operate
out of phase so that when the odd stages are outputting
their residue, the even stages are acquiring that residue
and visa versa.
When ENC is low, the analog input is sampled differentially
directly onto the input sample-and-hold capacitors, inside
the “Input S/H” shown in the block diagram. At the instant
that ENC transitions from low to high, the sampled input
is held. While ENC is high, the held input voltage is
buffered by the S/H amplifier which drives the first pipelined
ADC stage. The first stage acquires the output of the S/H
during this high phase of ENC. When ENC goes back low,
the first stage produces its residue which is acquired by
the second stage. At the same time, the input S/H goes
back to acquiring the analog input. When ENC goes back
high, the second stage produces its residue which is
acquired by the third stage. An identical process is re-
peated for the third stage, resulting in a third stage residue
that is sent to the fourth stage ADC for final evaluation.
Each ADC stage following the first has additional range to
accommodate flash and amplifier offset errors. Results
from all of the ADC stages are digitally synchronized such
that the results can be properly combined in the correction
logic before being sent to the output buffer.
SAMPLE/HOLD OPERATION AND INPUT DRIVE
Sample/Hold Operation
Figure 2 shows an equivalent circuit for the LTC1747
CMOS differential sample-and-hold. The differential ana-
log inputs are sampled directly onto sampling capacitors
(CSAMPLE) through CMOS transmission gates. This direct
capacitor sampling results in lowest possible noise for a
given sampling capacitor size. The capacitors shown
attached to each input (CPARASITIC) are the summation of
all other capacitance associated with each input.
During the sample phase when ENC/ENC is low, the
transmission gate connects the analog inputs to the sam-
pling capacitors and they charge to, and track the differen-
tial input voltage. When ENC/ENC transitions from low to
high the sampled input voltage is held on the sampling
capacitors. During the hold phase when ENC/ENC is high
the sampling capacitors are disconnected from the input
and the held voltage is passed to the ADC core for
processing. As ENC/ENC transitions from high to low the
inputs are reconnected to the sampling capacitors to
acquire a new sample. Since the sampling capacitors still
hold the previous sample, a charging glitch proportional to
the change in voltage between samples will be seen at this
time. If the change between the last sample and the new
sample is small the charging glitch seen at the input will be
small. If the input change is large, such as the change seen
with input frequencies near Nyquist, then a larger charging
glitch will be seen.
Common Mode Bias
The ADC sample-and-hold circuit requires differential drive
to achieve specified performance. Each input should swing
±0.8V for the 3.2V range or ±0.5V for the 2V range, around
a common mode voltage of 2.35V. The VCM output pin
(Pin 2) may be used to provide the common mode bias level.
VCM can be tied directly to the center tap of a transformer
to set the DC input level or as a reference level to an op amp
differential driver circuit. The VCM pin must be bypassed to
ground close to the ADC with a 4.7
F or greater capacitor.
APPLICATIO S I FOR ATIO
WU
UU
CSAMPLE
4pF
VDD
LTC1747
AIN
+
1747 F02
CSAMPLE
4pF
BIAS
VDD
5V
AIN
–
ENC
2V
6k
2V
6k
CPARASITIC
Figure 2. Equivalent Input Circuit
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| LTC1748CFW | 功能描述:IC ADC 14BIT 80MSPS 48-TSSOP RoHS:否 类别:集成电路 (IC) >> 数据采集 - 模数转换器 系列:- 标准包装:1 系列:- 位数:14 采样率（每秒）:83k 数据接口:串行，并联 转换器数目:1 功率耗散（最大）:95mW 电压电源:双 ± 工作温度:0°C ~ 70°C 安装类型:通孔 封装/外壳:28-DIP（0.600"，15.24mm） 供应商设备封装:28-PDIP 包装:管件 输入数目和类型:1 个单端，双极 |
| LTC1748CFW#PBF | 功能描述:IC ADC 14BIT 80MSPS 48-TSSOP RoHS:是 类别:集成电路 (IC) >> 数据采集 - 模数转换器 系列:- 标准包装:1 系列:- 位数:14 采样率（每秒）:83k 数据接口:串行，并联 转换器数目:1 功率耗散（最大）:95mW 电压电源:双 ± 工作温度:0°C ~ 70°C 安装类型:通孔 封装/外壳:28-DIP（0.600"，15.24mm） 供应商设备封装:28-PDIP 包装:管件 输入数目和类型:1 个单端，双极 |
| LTC1748CFW#TR | 功能描述:IC ADC SMPL 14BIT 80MSPS 48TSSOP RoHS:否 类别:集成电路 (IC) >> 数据采集 - 模数转换器 系列:- 标准包装:1 系列:- 位数:14 采样率（每秒）:83k 数据接口:串行，并联 转换器数目:1 功率耗散（最大）:95mW 电压电源:双 ± 工作温度:0°C ~ 70°C 安装类型:通孔 封装/外壳:28-DIP（0.600"，15.24mm） 供应商设备封装:28-PDIP 包装:管件 输入数目和类型:1 个单端，双极 |
| LTC1748CFW#TRPBF | 功能描述:IC ADC 14BIT 80MSPS 48-TSSOP RoHS:是 类别:集成电路 (IC) >> 数据采集 - 模数转换器 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:2,500 系列:- 位数:12 采样率（每秒）:3M 数据接口:- 转换器数目:- 功率耗散（最大）:- 电压电源:- 工作温度:- 安装类型:表面贴装 封装/外壳:SOT-23-6 供应商设备封装:SOT-23-6 包装:带卷 (TR) 输入数目和类型:- |
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