参数资料
型号: M27C801-70B6X
厂商: STMICROELECTRONICS
元件分类: PROM
英文描述: 1M X 8 OTPROM, 70 ns, PDIP32
封装: 0.600 INCH, PLASTIC, DIP-32
文件页数: 11/16页
文件大小: 153K
代理商: M27C801-70B6X
M27C801
4/16
DEVICE OPERATION
The operating modes of the M27C801 are listed in
the Operating Modes table. A single power supply
is required in the read mode. All inputs are TTL
levels except for GVPP and 12V on A9 for Elec-
tronic Signature and Margin Mode Set or Reset.
Read Mode
The M27C801 has two control functions, both of
which must be logically active in order to obtain
data at the outputs. Chip Enable (E) is the power
control and should be used for device selection.
Output Enable (G) is the output control and should
be used to gate data to the output pins, indepen-
dent of device selection. Assuming that the ad-
dresses are stable, the address access time
(tAVQV) is equal to the delay from E to output
(tELQV). Data is available at the output after a delay
of tGLQV from the falling edge of G, assuming that
E has been low and the addresses have been sta-
ble for at least tAVQV-tGLQV.
Standby Mode
The M27C801 has a standby mode which reduces
the supply current from 35mA to 100A.
The M27C801 is placed in the standby mode by
applying a CMOS high signal to the E input. When
in the standby mode, the outputs are in a high im-
pedance state, independent of the GVPP input.
Table 5. AC Measurement Conditions
High Speed
Standard
Input Rise and Fall Times
≤ 10ns
≤ 20ns (10% to 90%)
Input Pulse Voltages
0 to 3V
0.4 to 2.4V
Input and Output Timing Ref. Voltages
1.5V
0.8 and 2V
Figure 3. AC Testing Input Output Waveform
AI01822
3V
High Speed
0V
1.5V
2.4V
Standard
0.4V
2.0V
0.8V
Figure 4. AC Testing Load Circuit
AI01823B
1.3V
OUT
CL
CL = 30pF for High Speed
CL = 100pF for Standard
CL includes JIG capacitance
3.3k
1N914
DEVICE
UNDER
TEST
Table 6. Capacitance (1) (TA = 25 °C, f = 1 MHz)
Note: 1. Sampled only, not 100% tested.
Symbol
Parameter
Test Condition
Min
Max
Unit
CIN
Input Capacitance
VIN = 0V
6pF
COUT
Output Capacitance
VOUT = 0V
12
pF
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