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| 型号： | MA1916 |
| 厂商： | Dynex Semiconductor Ltd. |
| 英文描述： | Radiation Hard Reed-Solomon & Convolution Encoder |
| 中文描述： | 辐射硬里德所罗门 |
| 文件页数： | 10/11页 |
| 文件大小： | 94K |
| 代理商： | MA1916 |
MA1916
10/11
Figure 10: Flatpack Pinout
1 T2
2 T1
3 CE_CLKS
4 CE_IN
5 CE_OUT
6 TEST_POINT
7 N/C
8 ST1
9 GND
10 SEL_A
11 STZ
12 SEL_B
13 SZY
14 n_RST
28
MSG_OUT
27
CLK_OUT
26
SMC
25
RSE_OUT
24
SYZ
23
T3
22
CLKS
21
VDD
20
N/C
19
T0
18
MSG
17
CLK
16
READY
15
SMC_OUT
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RADIATION TOLERANCE
Total Dose Radiation Testing
For product procured to guaranteed total dose radiation
levels, each wafer lot will be approved when all sample
devices from each lot pass the total dose radiation test.
The sample devices will be subjected to the total dose
radiation level (Cobalt-60 Source), defined by the ordering
code, and must continue to meet the electrical parameters
specified in the data sheet. Electrical tests, pre and post
irradiation, will be read and recorded.
Dynex Semiconductor can provide radiation testing
compliant with Mil-Std-883 test method 1019, Ionizing
Radiation (Total Dose).
Total Dose (Function to specification)*
1x10
5
Rad(Si)
Transient Upset (Stored data loss)
5x10
10
Rad(Si)/sec
Transient Upset (Survivability)
>1x10
12
Rad(Si)/sec
Neutron Hardness (Function to specification)
>1x10
15
n/cm
2
Single Event Upset**
<1x10
-10
Errors/bit day
Latch Up
Not possible
* Other total dose radiation levels available on request
** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit
Table 9: Radiation Hardness Parameters
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