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参数资料
| 型号： | MACH445-12 |
| 厂商： | Lattice Semiconductor Corporation |
| 英文描述： | High-Density EE CMOS Programmable Logic |
| 中文描述： | 高密度电子工程CMOS可编程逻辑 |
| 文件页数： | 28/28页 |
| 文件大小： | 214K |
| 代理商： | MACH445-12 |
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MACH445-12/15/20
USING PRELOAD AND OBSERVABILITY
In order to be testable, a circuit must be both controllable
and observable. To achieve this, the MACH devices
incorporate register preload and observability.
In preload mode, each flip-flop in the MACH device can
be loaded from the I/O pins, in order to perform
functional testing of complex state machines. Register
preload makes it possible to run a series of tests from a
known starting state, or to load illegal states and test for
proper recovery. This ability to control the MACH
device’s internal state can shorten test sequences,
since it is easier to reach the state of interest.
The observability function makes it possible to see the
internal state of the buried registers during test by
overriding each register’s output enable and activating
the output buffer. The values stored in output and buried
registers can then be observed on the I/O pins. Without
this feature, a thorough functional test would be
impossible for any designs with buried registers.
While the implementation of the testability features is
fairly straightforward, care must be taken in certain
instances to insure valid testing.
One case involves asynchronous reset and preset. If the
MACH registers drive asynchronous reset or preset
lines and are preloaded in such a way that reset or
preset are asserted, the reset or preset may remove the
preloaded data. This is illustrated in Figure 2. Care
should be taken when planning functional tests, so that
states that will cause unexpected resets and presets are
not preloaded.
Another case to be aware of arises in testing combinato-
rial logic. When an output is configured as combinato-
rial, the observability feature forces the output into
registered mode. When this happens, all product terms
are forced to zero, which eliminates all combinatorial
data. For a straight combinatorial output, the correct
value will be restored after the preload or observe
function, and there will be no problem. If the function
implements a combinatorial latch, however, it relies on
feedback to hold the correct value, as shown in Figure 3.
As this value may change during the preload or observe
operation, you cannot count on the data being correct
after the operation. To insure valid testing in these
cases, outputs that are combinatorial latches should not
be tested immediately following a preload or observe
sequence, but should first be restored to a known state.
All MACH 2 devices support both preload and
observability.
Contact individual programming vendors in order to
verify programmer support.
AR
Figure 2. Preload/Reset Conflict
Q
1
On
Off
Preload
Mode
Q
2
AR
Preloaded
HIGH
D
Q
Q
1
D
Q
AR
Preloaded
HIGH
Q
2
17468E-26
Figure 3. Combinatorial Latch
Set
Reset
17468E-27
相关PDF资料 |
PDF描述 |
|---|---|
| MACH445-12YC | High-Density EE CMOS Programmable Logic |
| MACH445-15YC | High-Density EE CMOS Programmable Logic |
| MACH445-20YC | High-Density EE CMOS Programmable Logic |
| MACH5 | Fifth Generation MACH Architecture |
| MACHLV210-12 | High Density EE CMOS Programmable Logic |
相关代理商/技术参数 |
参数描述 |
|---|---|
| MACH44512YC | 制造商:LATTICE 功能描述:_ |
| MACH445-12YC | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| MACH445-15YC | 制造商:LATTICE 制造商全称:Lattice Semiconductor 功能描述:High-Density EE CMOS Programmable Logic |
| MACH445-20YC | 制造商:LATTICE 制造商全称:Lattice Semiconductor 功能描述:High-Density EE CMOS Programmable Logic |
| MACH465-12YC | 制造商:Advanced Micro Devices 功能描述: |
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