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参数资料
| 型号： | MAX3349EAEBE+T |
| 厂商： | Maxim Integrated Products |
| 文件页数： | 13/17页 |
| 文件大小： | 0K |
| 描述： | IC TXRX USB 2.0 FS 16-UCSP |
| 产品培训模块： | Lead (SnPb) Finish for COTS Obsolescence Mitigation Program |
| 标准包装： | 2,500 |
| 类型： | 收发器 |
| 驱动器/接收器数： | 1/1 |
| 规程： | USB 2.0 |
| 电源电压： | 4 V ~ 5.5 V |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 16-WFBGA，CSPBGA |
| 供应商设备封装： | 16-UCSP（2x2） |
| 包装： | 带卷 (TR) |
MAX3349EA
USB 2.0 Full-Speed Transceiver with UART
Multiplexing Mode
_______________________________________________________________________________________
5
TIMING CHARACTERISTICS (continued)
(VBUS = +4.0V to +5.5V, VUART = +2.7V to +3.3V, VL = +1.4V to +2.75V, TA = -40°C to +85°C, unless otherwise noted. Typical values
are at VBUS = +5V, VL = +1.8V, VUART = +2.75V (UART Mode), and TA = +25°C.) (Note 1)
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
High-to-off transition,
VL > +1.65V (Figure 5)
10
tPHZ_SE
High-to-off transition,
+1.4V < VL < +1.65V (Figure 5)
12
Low-to-off transition,
VL > +1.65V (Figure 5)
10
Single-Ended Receiver Disable
Delay
tPLZ_SE
Low-to-off transition,
+1.4V < VL < +1.65V (Figure 5)
12
ns
Off-to-high transition,
VL > +1.65V (Figure 5)
20
tPZH_SE
Off-to-high transition,
+1.4V < VL < +1.65 (Figure 5)
20
Off-to-low transition,
VL > +1.65V (Figure 5)
20
Single-Ended Receiver Enable
Delay
tPZL_SE
Off-to-low transition,
+1.4V < VL < +1.65V (Figure 5)
20
ns
UART DRIVER CHARACTERISTICS (CL = 200pF)
Rise Time (D-)
tFR_TUART
10% to 90% of
|VOHD - VOLD| (Figure 13)
60
200
ns
Fall Time (D-)
tFF_TUART
90% to 10% of
|VOHD - VOLD| (Figure 13)
60
200
ns
tPLH_TUART
(Figure 13)
70
200
Driver Propagation Delay
tPHL_TUART
(Figure 13)
70
200
ns
UART RECEIVER CHARACTERISTICS (CL = 15pF)
tPLH_RUART
(Figure 14)
60
Receiver (Rx) Propagation Delay
tPHL_RUART
(Figure 14)
60
ns
tFR_RUART
(Figure 14)
45
Receiver (Rx) Rise/Fall Time
tFF_RUART
(Figure 14)
45
ns
Note 1: Parameters are 100% production tested at TA =+25°C, unless otherwise noted. Limits over temperature are guaranteed
by design.
Note 2: Guaranteed by design, not production tested.
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