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参数资料
| 型号： | MC33288DDHR2 |
| 厂商： | Freescale Semiconductor |
| 文件页数： | 3/15页 |
| 文件大小： | 0K |
| 描述： | IC SSR FLASHER DUAL HSIDE 20HSOP |
| 标准包装： | 750 |
| 类型： | 高端 |
| 输入类型： | 非反相 |
| 输出数： | 2 |
| 导通状态电阻： | 20 毫欧 |
| 电流 - 输出 / 通道： | 8A |
| 电流 - 峰值输出： | 30A |
| 电源电压： | 8 V ~ 35 V |
| 工作温度： | -40°C ~ 125°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 20-SOIC（0.433"，11.00mm 宽）裸露焊盘 |
| 供应商设备封装： | 20-HSOP |
| 包装： | 带卷 (TR) |
MAXIMUM RATINGS
MAXIMUM RATINGS
Table 2. Maximum Ratings
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfuncion or
permanent damage to the device.
Ratings
Symbol
Value
Unit
ELECTRICAL RATINGS
V BAT Voltage with Respect to GND : Continuous/Pulse
OUT1 and OUT2 Voltage with Respect to GND : Continuous/Pulse
OUT1 to V BAT and OUT2 to V BAT Voltage : Continuous/Pulse
IN1, IN2, St DC Voltage : Continuous/Pulse
CUR R Voltage : Continuous/Pulse
ESD All Pins
Human Body Model (1)
Machine Model (2)
OUT1, OUT2 Output Current : Pulse (3)
IN1, IN2, STATUS
V BAT
V OUT
V OUT
V IN
V CR
V ESD1
V ESD2
I OUTP
I IN
-14 to 40
-0.3 to 40
40
-0.3 to 7.0
-0.3 to 7.0
±2000
±200
40
±5.0
V
V
V
V
V
V
A
mA
THERMAL RATINGS
Junction Temperature
Storage Temperature Range
Thermal Resistance Junction to Case
T J
T STORAGE
R θ JC
-40 to 150
-65 to 150
2.0
° C
° C
° C/W
Thermal Resistance Junction to Ambient
Power Dissipation at Tcase 140 ° C (5)
(4)
R θ JA
P D
25
5.0
° C/W
W
Notes
1. ESD1 testing is performed in accordance with the Human Body Model (C ZAP = 100 pF, R ZAP = 1500 ? ).
2.
3.
4.
5.
ESD2 testing is performed in accordance with the Machine Model (C ZAP = 200 pF, R ZAP = 0 ? ).
During lamp inrush current.
Device mounted on dual side printed circuit board with 70 μ m copper thickness and 10 cm 2 copper heat sink (2.5 cm 2 on top side and
7.5 cm 2 on down side).
Assuming a 150 ° C maximum junction temperature.
33288
Analog Integrated Circuit Device Data
Freescale Semiconductor
3
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