参数资料
型号: MC56F8346VFVER2
厂商: Freescale Semiconductor
文件页数: 72/178页
文件大小: 0K
描述: IC HYBRID CTRLR 16BIT 144-LQFP
标准包装: 500
系列: 56F8xxx
核心处理器: 56800E
芯体尺寸: 16-位
速度: 60MHz
连通性: CAN,EBI/EMI,SCI,SPI
外围设备: POR,PWM,温度传感器,WDT
输入/输出数: 62
程序存储器容量: 136KB(68K x 16)
程序存储器类型: 闪存
RAM 容量: 6K x 16
电压 - 电源 (Vcc/Vdd): 2.25 V ~ 3.6 V
数据转换器: A/D 16x12b
振荡器型: 外部
工作温度: -40°C ~ 105°C
封装/外壳: 144-LQFP
包装: 带卷 (TR)
配用: MC56F8367EVME-ND - EVAL BOARD FOR MC56F83X
Equivalent Circuit for ADC Inputs
56F8346 Technical Data, Rev. 15
Freescale Semiconductor
163
Preliminary
Figure 10-22 ADC Absolute Error Over Processing and Temperature Extremes Before
and After Calibration for VDCin = 0.60V and 2.70V
Note: The absolute error data shown in the graphs above reflects the effects of both gain error and offset
error. The data was taken on 15 parts: three each from four processing corner lots as well as three from one
nominally processed lot, each at three temperatures: -40°C, 27°C, and 150°C (giving the 45 data points
shown above), for two input DC voltages: 0.60V and 2.70V. The data indicates that for the given
population of parts, calibration significantly reduced (by as much as 39%) the collective variation (spread)
of the absolute error of the population. It also significantly reduced (by as much as 80%) the mean
(average) of the absolute error and thereby brought it significantly closer to the ideal value of zero.
Although not guaranteed, it is believed that calibration will produce results similar to those shown above
for any population of parts including those which represent processing and temperature extremes.
10.17 Equivalent Circuit for ADC Inputs
Figure 10-23 illustrates the ADC input circuit during sample and hold. S1 and S2 are always open/closed
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