参数资料
型号: MC9S08QB8CGK
厂商: FREESCALE SEMICONDUCTOR INC
元件分类: 微控制器/微处理器
英文描述: 8-BIT, FLASH, 20 MHz, MICROCONTROLLER, BCC24
封装: 5 X 5 MM, 1 MM HEIGHT, 0.65 MM PITCH, ROHS COMPLIANT, MO-220VHHC-1, QFN-24
文件页数: 9/36页
文件大小: 1331K
代理商: MC9S08QB8CGK
Electrical Characteristics
MC9S08QB8 Series MCU Data Sheet, Rev. 3
Freescale Semiconductor
17
Figure 12. Deviation of DCO Output from Trimmed Frequency (20 MHz, 3.0 V)
7C
Resolution of trimmed DCO output frequency at fixed voltage
and temperature (not using FTRIM)
Δfdco_res_t
± 0.2
± 0.4
%fdco
8C
Total deviation of DCO output from trimmed frequency3
Over full voltage and temperature range
Over fixed voltage and temperature range of 0 to 70
°C
Δfdco_t
–1.0 to 0.5
±0.5
± 2
± 1
%fdco
10
C FLL acquisition time4
tAcquire
——
1
ms
11
C
Long term jitter of DCO output clock (averaged over 2-ms
interval)5
CJitter
—0.02
0.2
%fdco
1 Data in Typical column was characterized at 3.0 V, 25
°C or is typical recommended value.
2 The resulting bus clock frequency should not exceed the maximum specified bus clock frequency of the device.
3 This parameter is characterized and not tested on each device.
4 This specification applies to any time the FLL reference source or reference divider is changed, trim value changed or changing
from FLL disabled (FBELP, FBILP) to FLL enabled (FEI, FEE, FBE, FBI). If a crystal/resonator is being used as the reference,
this specification assumes it is already running.
5 Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum f
Bus.
Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal. Noise
injected into the FLL circuitry via VDD and VSS and variation in crystal oscillator frequency increase the CJitter percentage for
a given interval.
Table 11. ICS Frequency Specifications (Temperature Range = –40 to 85
°C Ambient) (continued)
Num C
Characteristic
Symbol
Min.
Typical1
Max.
Unit
TBD
-2.00%
-1.50%
-1.00%
-0.50%
0.00%
0.50%
1.00%
-60
-40
-20
0
20
40
60
80
100
120
Temperature
D
evi
at
io
n
(
%
)
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