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| 型号： | MC9S08QE4CPG |
| 厂商： | FREESCALE SEMICONDUCTOR INC |
| 元件分类： | 微控制器/微处理器 |
| 英文描述： | 8-BIT, FLASH, 20 MHz, MICROCONTROLLER, PDIP16 |
| 封装： | ROHS COMPLIANT, PLASTIC, DIP-16 |
| 文件页数： | 24/46页 |
| 文件大小： | 1293K |
| 代理商： | MC9S08QE4CPG |
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MC9S08QE8 Series Data Sheet, Rev. 7
Ordering Information
Freescale Semiconductor
30
3.14.1
Conducted Transient Susceptibility
Microcontroller transient conducted susceptibility is measured in accordance with an internal Freescale
test method. The measurement is performed with the microcontroller installed on a custom EMC
evaluation board and running specialized EMC test software designed in compliance with the test method.
The conducted susceptibility is determined by injecting the transient susceptibility signal on each pin of
the microcontroller. The transient waveform and injection methodology is based on IEC 61000-4-4
(EFT/B). The transient voltage required to cause performance degradation on any pin in the tested
configuration is greater than or equal to the reported levels unless otherwise indicated by footnotes below
The susceptibility performance classification is described in Table 20.
4
Ordering Information
This section contains ordering information for the device numbering system.
Example of the device numbering system:
Table 19. Conducted Susceptibility, EFT/B
Parameter
Symbol
Conditions
fOSC/fBUS
Result
Amplitude1
(Min)
1 Data based on qualification test results. Not tested in production.
Unit
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
VCS_EFT
VDD = 3.3 V
TA = 25
oC
package type
32-pin LQFP
8 MHz
crystal
8 MHz bus
A2.3
kV
B4.0
C>4.0
D>4.0
Table 20. Susceptibility Performance Classification
Result
Performance Criteria
A
No failure
The MCU performs as designed during and after exposure.
B
Self-recovering
failure
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
C
Soft failure
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
D
Hard failure
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
E
Damage
The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.
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| MC9S08QE4CTG | 功能描述:8位微控制器 -MCU 4KB FLASH; 512 RAM RoHS:否 制造商:Silicon Labs 核心:8051 处理器系列:C8051F39x 数据总线宽度:8 bit 最大时钟频率:50 MHz 程序存储器大小:16 KB 数据 RAM 大小:1 KB 片上 ADC:Yes 工作电源电压:1.8 V to 3.6 V 工作温度范围:- 40 C to + 105 C 封装 / 箱体:QFN-20 安装风格:SMD/SMT |
| MC9S08QE4CTGR | 功能描述:8位微控制器 -MCU 4K Flash, 256 Ram RoHS:否 制造商:Silicon Labs 核心:8051 处理器系列:C8051F39x 数据总线宽度:8 bit 最大时钟频率:50 MHz 程序存储器大小:16 KB 数据 RAM 大小:1 KB 片上 ADC:Yes 工作电源电压:1.8 V to 3.6 V 工作温度范围:- 40 C to + 105 C 封装 / 箱体:QFN-20 安装风格:SMD/SMT |
| MC9S08QE4CWJ | 功能描述:8位微控制器 -MCU 4KB FLASH; 512 RAM RoHS:否 制造商:Silicon Labs 核心:8051 处理器系列:C8051F39x 数据总线宽度:8 bit 最大时钟频率:50 MHz 程序存储器大小:16 KB 数据 RAM 大小:1 KB 片上 ADC:Yes 工作电源电压:1.8 V to 3.6 V 工作温度范围:- 40 C to + 105 C 封装 / 箱体:QFN-20 安装风格:SMD/SMT |
| MC9S08QE4CWL | 功能描述:8位微控制器 -MCU 4KB FLASH; 512 RAM RoHS:否 制造商:Silicon Labs 核心:8051 处理器系列:C8051F39x 数据总线宽度:8 bit 最大时钟频率:50 MHz 程序存储器大小:16 KB 数据 RAM 大小:1 KB 片上 ADC:Yes 工作电源电压:1.8 V to 3.6 V 工作温度范围:- 40 C to + 105 C 封装 / 箱体:QFN-20 安装风格:SMD/SMT |
| MC9S08QE64CFT | 功能描述:8位微控制器 -MCU 8 BIT, 64K FLASH RoHS:否 制造商:Silicon Labs 核心:8051 处理器系列:C8051F39x 数据总线宽度:8 bit 最大时钟频率:50 MHz 程序存储器大小:16 KB 数据 RAM 大小:1 KB 片上 ADC:Yes 工作电源电压:1.8 V to 3.6 V 工作温度范围:- 40 C to + 105 C 封装 / 箱体:QFN-20 安装风格:SMD/SMT |
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