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参数资料
型号： MC9S12B64MFU25
厂商： MOTOROLA INC
元件分类： 微控制器/微处理器
英文描述： 16-BIT, FLASH, 25 MHz, MICROCONTROLLER, PQFP80
封装： QFP-80
文件页数： 110/128页
文件大小： 1817K
代理商： MC9S12B64MFU25
Device User Guide — 9S12B128DGV1/D V01.10
82
A.1.6 ESD Protection and Latch-up Immunity
All ESD testing is in conformity with CDF-AEC-Q100 Stress test qualification for Automotive Grade
Integrated Circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM), the Machine Model (MM) and the Charge Device Model.
A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
Table A-1 Absolute Maximum Ratings1
NOTES:
1. Beyond absolute maximum ratings device might be damaged.
Num
Rating
Symbol
Min
Max
Unit
1
I/O, Regulator and Analog Supply Voltage
VDD5
-0.3
6.5
V
2
Internal Logic Supply Voltage 2
2. The device contains an internal voltage regulator to generate the logic and PLL supply out of the I/O supply.
The absolute maximum ratings apply when the device is powered from an external source.
VDD
-0.3
3.0
V
3
PLL Supply Voltage 2
VDDPLL
-0.3
3.0
V
4
Voltage difference VDDX to VDDR and VDDA
VDDX
-0.3
0.3
V
5
Voltage difference VSSX to VSSR and VSSA
VSSX
-0.3
0.3
V
6
Digital I/O Input Voltage
VIN
-0.3
6.5
V
7
Analog Reference
VRH, VRL
-0.3
6.5
V
8
XFC, EXTAL, XTAL inputs
VILV
-0.3
3.0
V
9
TEST input
VTEST
-0.3
10.0
V
10
Instantaneous Maximum Current
Single pin limit for all digital I/O pins 3
3. All digital I/O pins are internally clamped to VSSX and VDDX, VSSR and VDDR or VSSA and VDDA.
I
D
-25
+25
mA
11
Instantaneous Maximum Current
Single pin limit for XFC, EXTAL, XTAL4
4. Those pins are internally clamped to VSSPLL and VDDPLL.
I
DL
-25
+25
mA
12
Instantaneous Maximum Current
Single pin limit for TEST 5
5. This pin is clamped low to VSSR, but not clamped high. This pin must be tied low in applications.
I
DT
-0.25
0
mA
15
Storage Temperature Range
T
stg
– 65
155
°C
Table A-2 ESD and Latch-up Test Conditions
Model
Description
Symbol
Value
Unit
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