参数资料
型号: MC9SA256BCFUR2
厂商: FREESCALE SEMICONDUCTOR INC
元件分类: 微控制器/微处理器
英文描述: 16-BIT, FLASH, 8 MHz, MICROCONTROLLER, PQFP80
封装: QFP-80
文件页数: 75/102页
文件大小: 1050K
代理商: MC9SA256BCFUR2
MC9S12A256 Device Guide — V01.01
74
A.3.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The failure rates for data retention and program/erase cycling are specified at the operating conditions
noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
NOTE:
All values shown in Table A-12 are target values and subject to further extensive
characterization.
NOTE:
Flash cycling performance is 1000 cycles at –40 to + 85
°C. Data Retention is
specified for 10 years.
NOTE:
EEPROM cycling performance is 10,000 cycles at –40 to +85
°C. Data retention is
specified for 10 years.
NOTE:
These figures are provided for commercial quality levels not automotive.
Table A-12 NVM Reliability Characteristics
Conditions are shown in Table A-4 unless otherwise noted
Num
C
NVM Array
Cycles
Data Retention
Lifetime
1
C Flash/EEPROM (–40 to +85°C)
1000
10 years
2
C EEPROM (–40 to +85°C)
10,000
10 years
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