收藏本站
参数资料
型号： MCF51MM128VLK
厂商： Freescale Semiconductor
文件页数： 10/57页
文件大小： 0K
描述： IC MCU 32BIT 128K COLDF 81-LQFP
标准包装： 480
系列： MCF51MM
核心处理器： Coldfire V1
芯体尺寸： 32-位
速度： 50MHz
连通性： CAN，EBI/EMI，I²C，SCI，SPI，USB OTG
外围设备： LVD，PWM，WDT
输入/输出数： 47
程序存储器容量： 128KB（128K x 8）
程序存储器类型： 闪存
RAM 容量： 32K x 8
电压 - 电源 (Vcc/Vdd)： 1.8 V ~ 3.6 V
数据转换器： A/D 8x16b，D/A 1x12b
振荡器型： 外部
工作温度： -40°C ~ 105°C
封装/外壳： 80-LQFP
包装： 托盘
Electrical Characteristics
Freescale Semiconductor
18
For most applications, PI/O Pint and can be neglected. An approximate relationship between PD and TJ
(if PI/O is neglected) is:
PD = K (TJ + 273C)
Eqn. 2
Solving Equation 1 and Equation 2 for K gives:
K = PD (TA + 273C) + JA (PD)2
Eqn. 3
where K is a constant pertaining to the particular part. K can be determined from Equation 3 by measuring
PD (at equilibrium) for a known TA. Using this value of K, the values of PD and TJ can be obtained by
solving Equation 1 and Equation 2 iteratively for any value of TA.
3.4
ESD Protection Characteristics
Although damage from static discharge is much less common on these devices than on early CMOS
circuits, normal handling precautions should be used to avoid exposure to static discharge. Qualification
tests are performed to ensure that these devices can withstand exposure to reasonable levels of static
without suffering any permanent damage.
All ESD testing is in conformity with CDF-AEC-Q00 Stress Test Qualification for Automotive Grade
Integrated Circuits. (http://www.aecouncil.com/) This device was qualified to AEC-Q100 Rev E.
A device is considered to have failed if, after exposure to ESD pulses, the device no longer meets the
device specification requirements. Complete dc parametric and functional testing is performed per the
applicable device specification at room temperature followed by hot temperature, unless specified
otherwise in the device specification.
Table 7. ESD and Latch-up Test Conditions
Model
Description
Symbol
Value
Unit
Human Body
Series Resistance
R1
1500
Storage Capacitance
C
100
pF
Number of Pulse per pin
—
3
—
Machine
Series Resistance
R1
0
Storage Capacitance
C
200
pF
Number of Pulse per pin
—
3
—
Latch-up
Minimum input voltage limit
—
–2.5
V
Maximum input voltage limit
—
7.5
V
Table 8. ESD and Latch-Up Protection Characteristics
#
Rating
Symbol
Min
Max
Unit
C
1
Human Body Model (HBM)
VHBM
2000
—
V
T
2
Machine Model (MM)
VMM
200
—
V
T
MCF51MM256/128, Rev. 5
相关PDF资料
PDF描述
MC908QC16VDSE IC MCU 8BIT 16K FLASH 20-TSSOP
MC9S08DZ128MLF MCU 8BIT 128K FLASH 48-LQFP
VI-BW4-IW-B1 CONVERTER MOD DC/DC 48V 100W
MC908KX2VDWE IC MCU 2K FLASH 8MHZ 16-SOIC
VI-B20-IX-B1 CONVERTER MOD DC/DC 5V 75W
相关代理商/技术参数
参数描述
MCF51MM128VLL 制造商:Freescale Semiconductor 功能描述:32BIT 128K FLASH - Bulk
MCF51MM128VMB 功能描述:32位微控制器 - MCU 32BIT 128K FLASH RoHS:否 制造商:Texas Instruments 核心:C28x 处理器系列:TMS320F28x 数据总线宽度:32 bit 最大时钟频率:90 MHz 程序存储器大小:64 KB 数据 RAM 大小:26 KB 片上 ADC:Yes 工作电源电压:2.97 V to 3.63 V 工作温度范围:- 40 C to + 105 C 封装 / 箱体:LQFP-80 安装风格:SMD/SMT
MCF51MM256 制造商:FREESCALE 制造商全称:Freescale Semiconductor, Inc 功能描述:low-cost, low-power, high-performance ColdFire?? V1 family of 32-bit microcontrollers (MCUs) designed for handheld metering devices.
MCF51MM256CLK 功能描述:32位微控制器 - MCU 32BIT 256K FLASH RoHS:否 制造商:Texas Instruments 核心:C28x 处理器系列:TMS320F28x 数据总线宽度:32 bit 最大时钟频率:90 MHz 程序存储器大小:64 KB 数据 RAM 大小:26 KB 片上 ADC:Yes 工作电源电压:2.97 V to 3.63 V 工作温度范围:- 40 C to + 105 C 封装 / 箱体:LQFP-80 安装风格:SMD/SMT
MCF51MM256CLL 功能描述:32位微控制器 - MCU 32BIT 256K FLASH RoHS:否 制造商:Texas Instruments 核心:C28x 处理器系列:TMS320F28x 数据总线宽度:32 bit 最大时钟频率:90 MHz 程序存储器大小:64 KB 数据 RAM 大小:26 KB 片上 ADC:Yes 工作电源电压:2.97 V to 3.63 V 工作温度范围:- 40 C to + 105 C 封装 / 箱体:LQFP-80 安装风格:SMD/SMT
发布紧急采购，3分钟左右您将得到回复。

采购需求

(若只采购一条型号，填写一行即可)

发布成功！您可以继续发布采购。也可以进入我的后台，查看报价

发布成功！您可以继续发布采购。也可以进入我的后台，查看报价

*型号 *数量 厂商 批号 封装
添加更多采购

我的联系方式

*
*
*