参数资料
型号: MCF51QF128VHS
厂商: FREESCALE SEMICONDUCTOR INC
元件分类: 微控制器/微处理器
英文描述: FLASH, 50 MHz, MICROCONTROLLER, QCC44
封装: 5 X 5 MM, QFN-44
文件页数: 21/72页
文件大小: 1031K
代理商: MCF51QF128VHS
1. Assumes 25MHz flash clock frequency.
2. Maximum times for erase parameters based on expectations at cycling end-of-life.
3. For byte-writes to an erased FlexRAM location, the aligned word containing the byte must be erased.
6.4.1.3 Flash (FTFL) current and power specfications
Table 19. Flash (FTFL) current and power specfications
Symbol
Description
Typ.
Unit
IDD_PGM
Worst case programming current in program flash
10
mA
6.4.1.4 Reliability specifications
Table 20. NVM reliability specifications
Symbol
Description
Min.
Typ.1
Max.
Unit
Notes
Program Flash
tnvmretp10k Data retention after up to 10 K cycles
5
TBD
years
tnvmretp1k Data retention after up to 1 K cycles
10
TBD
years
tnvmretp100 Data retention after up to 100 cycles
15
TBD
years
nnvmcycp
Cycling endurance
10 K
TBD
cycles
Data Flash
tnvmretd10k Data retention after up to 10 K cycles
5
TBD
years
tnvmretd1k Data retention after up to 1 K cycles
10
TBD
years
tnvmretd100 Data retention after up to 100 cycles
15
TBD
years
nnvmcycd
Cycling endurance
10 K
TBD
cycles
FlexRAM as EEPROM
tnvmretee100 Data retention up to 100% of write endurance
5
TBD
years
tnvmretee10 Data retention up to 10% of write endurance
10
TBD
years
tnvmretee1 Data retention up to 1% of write endurance
15
TBD
years
nnvmwree16
nnvmwree128
nnvmwree512
nnvmwree4k
nnvmwree8k
Write endurance
EEPROM backup to FlexRAM ratio = 16
EEPROM backup to FlexRAM ratio = 128
EEPROM backup to FlexRAM ratio = 512
EEPROM backup to FlexRAM ratio = 4096
EEPROM backup to FlexRAM ratio = 8192
35 K
315 K
1.27 M
10 M
20 M
TBD
writes
1. Typical data retention values are based on intrinsic capability of the technology measured at high temperature derated to
25°C. For additional information on how Freescale defines typical data retention, please refer to Engineering Bulletin
EB618.
2. Data retention is based on Tjavg = 55°C (temperature profile over the lifetime of the application).
3. Cycling endurance represents number of program/erase cycles at -40°C ≤ Tj ≤ 125°C.
Memories and memory interfaces
MCF51JF128 Advance Information Data Sheet, Rev. 3, 08/2011.
28
Preliminary
Freescale Semiconductor, Inc.
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