参数资料
型号: MCP40D18T-502AE/LT
厂商: Microchip Technology
文件页数: 23/43页
文件大小: 0K
描述: IC POT 7BIT 5K I2C SC-70-6
标准包装: 3,000
接片: 128
电阻(欧姆): 5k
电路数: 1
温度系数: 标准值 150 ppm/°C
存储器类型: 易失
接口: I²C
电源电压: 1.8 V ~ 5.5 V
工作温度: -40°C ~ 125°C
安装类型: 表面贴装
封装/外壳: 6-TSSOP(5 引线),SC-88A,SOT-353
供应商设备封装: SC-70-5
包装: 带卷 (TR)
2009 Microchip Technology Inc.
DS22152B-page 3
MCP40D17/18/19
1.0
ELECTRICAL
CHARACTERISTICS
Absolute Maximum Ratings
Voltage on VDD with respect to VSS ..... -0.6V to +7.0V
Voltage on SCL, and SDA with respect to VSS
............................................................................. -0.6V to 12.5V
Voltage on all other pins (A, W, and B)
with respect to VSS ............................ -0.3V to VDD + 0.3V
Input clamp current, IIK
(VI < 0, VI > VDD, VI > VPP ON HV pins) ........... ±20 mA
Output clamp current, IOK
(VO < 0 or VO > VDD) ....................................... ±20 mA
Maximum output current sunk by any Output pin
........................................................................... 25 mA
Maximum output current sourced by any Output pin
........................................................................... 25 mA
Maximum current out of VSS pin ...................... 100 mA
Maximum current into VDD pin ......................... 100 mA
Maximum current into A, W and B pins........... ±2.5 mA
Package power dissipation (TA = +50°C, TJ = +150°C)
SC70-5 ............................................................ 302 mW
SC70-6 ............................................................ 483 mW
Storage temperature .......................... -65°C to +150°C
Ambient temperature with power applied
........................................................... -40°C to +125°C
ESD protection on all pins
........................≥ 4 kV (HBM)
........................................................................≥ 400V (MM)
Maximum Junction Temperature (TJ) .............. +150°C
Notice: Stresses above those listed under “Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of
the device at those or any other conditions above those
indicated in the operational listings of this specification
is not implied. Exposure to maximum rating conditions
for extended periods may affect device reliability.
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