参数资料
型号: MPC7410RX400LD
厂商: FREESCALE SEMICONDUCTOR INC
元件分类: 微控制器/微处理器
英文描述: 32-BIT, 400 MHz, RISC PROCESSOR, CBGA360
封装: 25 X 25 MM, 3.20 MM HEIGHT, 1.27 MM PITCH, CERAMIC, BGA-360
文件页数: 53/56页
文件大小: 864K
代理商: MPC7410RX400LD
MPC7410 RISC Microprocessor Hardware Specifications, Rev. 6.1
6
Freescale Semiconductor
Features
— L2 is fully pipelined to provide 128 bits per L2 clock cycle to the L1s.
— Up to eight outstanding, out-of-order, cache misses between dL1 and L2/bus
— Up to seven outstanding, out-of-order transactions on the bus
— Load folding to fold new dL1 misses into older, outstanding load and store misses to the same line
— Store miss merging for multiple store misses to the same line. Only coherency action taken (that is,
address only) for store misses merged to all 32 bytes of a cache line (no data tenure needed).
— Two-entry finished store queue and four-entry completed store queue between load/store unit and dL1
— Separate additional queues for efficient buffering of outbound data (castouts, write throughs, and so on)
from dL1 and L2
Bus interface
— MPX bus extension to 60x processor interface
— Mode-compatible with 60x processor interface
— 32-bit address bus
— 64-bit data bus
— Bus-to-core frequency multipliers of 2x, 2.5x, 3x, 3.5x, 4x, 4.5x, 5x, 5.5x, 6x, 6.5x, 7x, 7.5x, 8x, 9x
supported
— Selectable interface voltages of 1.8, 2.5, and 3.3 V
Power management
— Low-power design with thermal requirements very similar to MPC740 and MPC750
— Low-voltage processor core
— Selectable interface voltages can reduce power in output buffers
— Three static power saving modes: doze, nap, and sleep
— Dynamic power management
Testability
— LSSD scan design
— IEEE Std 1149.1 JTAG interface
— Array built-in self test (ABIST)—factory test only
— Redundancy on L1 data arrays and L2 tag arrays
Reliability and serviceability
— Parity checking on 60x and L2 cache buses
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