参数资料
型号: NB7V52MMNTXG
厂商: ON Semiconductor
文件页数: 4/10页
文件大小: 0K
描述: IC FLIP FLOP DIFF RST/CML 16-QFN
标准包装: 3,000
功能: 复位
类型: D 型
输出类型: 差分
元件数: 1
每个元件的位元数: 1
延迟时间 - 传输: 300ps
触发器类型: 负边沿
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 16-VFQFN 裸露焊盘
包装: 带卷 (TR)
NB7V52M
http://onsemi.com
3
Table 2. ATTRIBUTES
Characteristics
Value
ESD Protection
Human Body Model
Machine Model
> 2 kV
> 200 V
Moisture Sensitivity
16QFN
Level 1
Flammability Rating
Oxygen Index: 28 to 34
UL 94 V0 @ 0.125 in
Transistor Count
173
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
For additional information, see Application Note AND8003/D.
Table 3. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC
Positive Power Supply
VEE = 0 V
3.0
V
VIO
Positive Input/Output Voltage
VEE = 0 V
0.5 v VIO v VCC + 0.5
0.5 to VCC +0.5
V
VINPP
Differential Input Voltage |CLK CLK|, |D D|,
|R R|
1.89
V
IOUT
Output Current Through RTOUT (50 W Resistor)
Continuous
Surge
34
40
mA
IIN
Input Current Through RTIN (50 W Resistor)
$40
mA
TA
Operating Temperature Range
40 to +85
°C
Tstg
Storage Temperature Range
65 to +150
°C
qJA
Thermal Resistance (JunctiontoAmbient)
(Note 3)
0 lfpm
500 lfpm
QFN16
42
35
°C/W
qJC
Thermal Resistance (JunctiontoCase) (Note 3)
QFN16
4
°C/W
Tsol
Wave Solder
PbFree
265
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
3. JEDEC standard multilayer board 2S2P (2 signal, 2 power) with 8 filled thermal vias under exposed pad.
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