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参数资料
| 型号： | NCP1252TSFWDGEVB |
| 厂商： | ON Semiconductor |
| 文件页数： | 2/18页 |
| 文件大小： | 0K |
| 描述： | BOARD DEMO NCP1252 PWM CTLR |
| 设计资源： | NCP1252TSFWDGEVB Schematic NCP1252TSFWDGEVB Gerber Files NCP1252TSFWDGEVB Bill of Materials |
| 标准包装： | 1 |
| 主要目的： | AC/DC，主面 |
| 输出及类型： | 1，隔离 |
| 输出电压： | 12V |
| 电流 - 输出： | 10A |
| 稳压器拓扑结构： | 正向转换器 |
| 板类型： | 完全填充 |
| 已供物品： | 板 |
| 已用 IC / 零件： | NCP1252 |
| 其它名称： | NCP1252TSFWDGEVB-ND NCP1252TSFWDGEVBOS |
NCP1252
Vbulk
Vout
NCP1252
1
2
3
4
8
7
6
5
Vcc
100 nF*
*Minimum recommended
decoupling capacitor value
Figure 1. Typical Application
Table 1. PIN FUNCTIONS
Pin No.
1
2
3
4
5
6
7
8
Pin Name
FB
BO
CS
R T
GND
Drv
V CC
SSTART
Function
Feedback
Brown ? out input
Current sense
Timing element
?
Driver
V CC
Soft ? start
Pin Description
This pin directly connects to an optocoupler collector.
This pin monitors the input voltage image to offer a Brown ? out protection.
Monitors the primary current and allows the selection of the ramp com-
pensation amplitude.
A resistor connected to ground fixes the switching frequency.
The controller ground pin.
This pin connects to the MOSFET gate
This pin accepts voltage range from 8 V up to 28 V
A capacitor connected to ground selects the soft ? start duration. The soft
start is grounded during the delay timer
Table 2. MAXIMUM RATINGS TABLE (Notes 1 and 2)
Symbol
V CC
V CC
I Vcc
R θ JA – PDIP8
R θ JA – SOIC8
TJ MAX
Rating
Power Supply voltage, Vcc pin, transient voltage: 10 ms with I Vcc < 20 mA
Power Supply voltage, Vcc pin, continuous voltage
Maximum current injected into pin 7
Maximum voltage on low power pins (except pin 6, 7)
Thermal Resistance Junction ? to ? Air – PDIP8
Thermal Resistance Junction ? to ? Air – SOIC8
Maximum Junction Temperature
Storage Temperature Range
ESD Capability, HBM model
ESD Capability, Machine Model
Value
30
28
20
? 0.3 to 10
131
169
150
? 60 to +150
1.8
200
Unit
V
V
mA
V
° C/W
° C/W
° C
° C
kV
V
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. This device series contains ESD protection and exceeds the following tests: Human Body Model 1800 V per JEDEC Standard
JESD22 ? A114E. Machine Model Method 200 V per JEDEC Standard JESD22 ? A115A.
2. This device contains latch ? up protection and exceeds 100 mA per JEDEC Standard JESD78.
http://onsemi.com
2
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