参数资料
型号: NDS7002A_D87Z
厂商: Fairchild Semiconductor
文件页数: 1/7页
文件大小: 0K
描述: MOSFET N-CH 60V 280MA SOT-23
产品变化通告: Mold Compound Change 12/Dec/2007
Product Discontinuation 03/Dec/2009
标准包装: 10,000
FET 型: MOSFET N 通道,金属氧化物
FET 特点: 逻辑电平门
漏极至源极电压(Vdss): 60V
电流 - 连续漏极(Id) @ 25° C: 280mA
开态Rds(最大)@ Id, Vgs @ 25° C: 2 欧姆 @ 500mA,10V
Id 时的 Vgs(th)(最大): 2.5V @ 250µA
输入电容 (Ciss) @ Vds: 50pF @ 25V
功率 - 最大: 300mW
安装类型: 表面贴装
封装/外壳: TO-236-3,SC-59,SOT-23-3
供应商设备封装: SOT-23
包装: 带卷 (TR)
November 1995
2N7000 / 2N7002 / NDS7002A
N-Channel Enhancement Mode Field Effect Transistor
General Description
These N-Channel enhancement mode field effect transistors
are produced using Fairchild's proprietary, high cell density,
DMOS technology. These products have been designed to
minimize on-state resistance while provide rugged, reliable,
and fast switching performance. They can be used in most
applications requiring up to 400mA DC and can deliver
Features
High density cell design for low R DS(ON) .
Voltage controlled small signal switch.
Rugged and reliable.
High saturation current capability.
pulsed currents up to 2A. These products are particularly
suited for low voltage, low current applications such as small
servo motor control, power MOSFET gate drivers, and other
switching applications.
___________________________________________________________________________________________
D
G
D
G
S
TO-92
2N7000
Absolute Maximum Ratings
(TO-236AB)
2N7002/NDS7002A
T A = 25°C unless otherwise noted
S
Symbol
V DSS
V DGR
V GSS
Parameter
Drain-Source Voltage
Drain-Gate Voltage (R GS < 1 M ? )
Gate-Source Voltage - Continuous
2N7000
2N7002
60
60
± 20
NDS7002A
Units
V
V
V
- Non Repetitive (tp < 50μs)
± 40
Derated above 25 C
I D
P D
T J ,T STG
T L
Maximum Drain Current - Continuous
- Pulsed
Maximum Power Dissipation
o
Operating and Storage Temperature Range
Maximum Lead Temperature for Soldering
200
500
400
3.2
-55 to 150
115
800
200
1.6
300
280
1500
300
2.4
-65 to 150
mA
mW
mW/°C
°C
°C
Purposes, 1/16" from Case for 10 Seconds
THERMAL CHARACTERISTICS
R θ JA
Thermal Resistance, Junction-to-Ambient
312.5
625
417
°C/W
? 1997 Fairchild Semiconductor Corporation
2N7000.SAM Rev. A1
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