参数资料
型号: NUP4114UCLW1T2G
厂商: ON Semiconductor
文件页数: 6/9页
文件大小: 0K
描述: TVS ARRAY QUAD UNIDIR SC88
标准包装: 3,000
电压 - 反向隔离(标准值): 5.5V
电压 - 击穿: 6V
电极标记: 4 通道阵列 - 双向
安装类型: 表面贴装
封装/外壳: 6-TSSOP,SC-88,SOT-363
供应商设备封装: SC-88
包装: 带卷 (TR)
NUP4114 Series, SZNUP4114HMR6T1G
Implementing this topology with discrete devices does have
disadvantages. This configuration is shown below:
layout. Taking care to minimize the effects of parasitic
inductance will provide significant benefits in transient
immunity.
Power
Supply
V CC
I ESDpos
Even with good board layout, some disadvantages are still
present when discrete diodes are used to suppress ESD
events across datalines and the supply rail. Discrete diodes
with good transient power capability will have larger die and
Protected Data Line
Device
D1
D2
I ESDpos
I ESDneg
VF + V CC
I ESDneg
therefore higher capacitance. This capacitance becomes
problematic as transmission frequencies increase. Reducing
capacitance generally requires reducing die size. These
small die will have higher forward voltage characteristics at
typical ESD transient current levels. This voltage combined
with the smaller die can result in device failure.
? VF
Looking at the figure above, it can be seen that when a
positive ESD condition occurs, diode D1 will be forward
biased while diode D2 will be forward biased when a
negative ESD condition occurs. For slower transient
conditions, this system may be approximated as follows:
For positive pulse conditions:
The ON Semiconductor NUP4114 was developed to
overcome the disadvantages encountered when using
discrete diodes for ESD protection. This device integrates a
TVS diode within a network of steering diodes.
5
V c = V CC + V fD1
1
6
3
4
For negative pulse conditions:
V c = ? V fD2
ESD events can have rise times on the order of some
number of nanoseconds. Under these conditions, the effect
of parasitic inductance must be considered. A pictorial
representation of this is shown below.
2
Figure 7. NUP4114 Equivalent Circuit
Power
Supply
I ESDpos
During an ESD condition, the ESD current will be driven
to ground through the TVS diode as shown below.
V CC
Protected
Device
Data Line
D1
I ESDpos
I ESDneg
Power
Supply
V CC
D2
V C = V CC + Vf + (L diESD/dt)
I ESDneg
Protected
D1
I ESDpos
Device
Data Line
D2
V C = ? Vf ? (L diESD/dt)
An approximation of the clamping voltage for these fast
transients would be:
For positive pulse conditions:
V c = V CC + Vf + (L di ESD /dt)
For negative pulse conditions:
V c = ? V f – (L di ESD /dt)
As shown in the formulas, the clamping voltage (V c ) not
only depends on the Vf of the steering diodes but also on the
L di ESD /dt factor. A relatively small trace inductance can
result in hundreds of volts appearing on the supply rail. This
endangers both the power supply and anything attached to
The resulting clamping voltage on the protected IC will
be:
V c = V F + V TVS .
The clamping voltage of the TVS diode depends on the
magnitude of the ESD current. The steering diodes are fast
switching devices with unique forward voltage and low
capacitance characteristics.
that rail. This highlights the importance of good board
http://onsemi.com
6
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