参数资料
型号: PKS2113PI
厂商: ERICSSON POWER MODULES AB
元件分类: 电源模块
英文描述: 1-OUTPUT 15 W DC-DC REG PWR SUPPLY MODULE
文件页数: 12/12页
文件大小: 1280K
代理商: PKS2113PI
9
EN/LZT 146 28 R1A (Replaces EN/LZT 137 10 R7 Ericsson Microelectronics AB, June 2000
Part no.
D1
IN4745B
Zener Diode
16 V, 1 W, 5%
D2
MBR190
Schottky Diode
90 V, 1 A
R1
Resistor, Film
10 k
W, 1/2 W, 5%
Fig. 5
Circuit Operation
When the input voltage is below the zener voltage of D1, the remote
ON/OFF pin is pulled to the same potential as the minus input pin
through resistor R1, keeping the DC/DC power module off. When
the input voltage rises above the zener voltage D1 will conduct,
producing a voltage drop across resistor R1 greater than 1.8 V above
the minus input pin, turning the power module on. Diode D2
enables the remote ON/OFF pin to function normally with other
external circuitry.
This undervoltage lockout circuit will keep the power module off
until the input voltage source reaches the zener voltage.
Maximum Capacitive Load
The maximum recommended capacitance connected directly to the
PKS DC/DC power modules output without resistance or inductance
in series is 100
mF/A (output current rating). Connect capacitors
across the load for maximum effectiveness and maximum stability
margins.
Current Limiting Protection
Two independent output current detection circuits protect the PKS
2000 series from any damage if the output is overloaded or shorted.
Due to its current mode control and laser trimming of the current
sense resistor, a precision current limit operating point is set. During
an overload condition, the output voltage and duty cycle are reduced.
When a short-circuit or very low impedance condition such as a
shorted capacitor, is present, the power module operates at a very
narrow duty cycle to limit its internal power dissipation. The power
module will automatically resume normal operation after the
overload or short-circuit condition is removed.
Reliability Prediction Methods
While several prediction standards exist, no one standard can be
considered optimum for all situations. A particular standard must be
chosen based on the operating conditions and the operating environ-
ment that best reflects the end application.
Quality
[2]
Undervoltage Lockout Circuit Components
The telecommunications industry often uses Bellcore's Technical
Reference TR-NWT-00332, Reliability Prediction Procedure for
Electronic Equipment as their standard. This document includes 3
different prediction methods – “Parts Count Method”, “Combining
Laboratory Data With Parts Count Data” and “Predictions From
Field Tracking”. Within each method are several different cases that
define the various conditions.
MIL-HDBK-217, Reliability Prediction of Electronic Equipment is a
widely used standard that defines two prediction methods – Part
Stress Analysis Prediction that is applicable during later design
phases and Parts Count Reliability Prediction that is applicable
during early design phase and during proposal formulation.
Bellcore
Using Bellcore’s TR-NWT-000332, Method 1, Case 1, the predicted
failure rate for the PKS series is 250 FITs (Failures in 109 hours) or
an MTBF (Mean Time Between Failure) of 4,000,000 hours. MTBF
is the inverse of the failure rate. This number is derived using the
parts count method and it assumes that all components have 50%
stress and an ambient temperature of 40 °C in a ground, fixed,
controlled environment. TR-NWT-000332 states that Method 1
prediction must be provided for all units unless the requesting
organization allows otherwise. Using the same method but for a
ground, fixed, uncontrolled environment, the calculated reliability
would be 375 FIT or an MTBF of 2,666,667 hours.
MIL-HDBK-217
For a Part Stress Analysis Prediction, reliability is determined by
adding the failure rate of each part. The failure rate of each part is
evaluated individually and is calculated by including the variables of
temperature, stress level, base failure rate, power rating, part quality
factor, and operating environment factor. For example, Eq [1] is the
formula for calculating the part failure rate,
lp, for a fixed film
resistor.
lp = lb pR pQ pE Failures/106 Hours
[1]
where,
lb = 5 10-5 (3.5)
exp [S ×
]
pR = Resistance factor
pQ = Quality factor
pE = Environment factor
lb is the base failure rate where T is the ambient temperature in
degrees C and S is the ratio of operating power to rated power. The
values are found in lookup tables within MIL-HDBK-217. The
MTBF is equal to the inverse of the sum of all the part failure rates:
MTBF =
The PKS series has a predicted reliability of over 1,000,000 hours
MTBF in a ground benign environment. The part quality factor used
as stated in MIL-HDBK-217 is equal to “lower” (lower than military
rated components). The operating conditions are 26 volts input and
maximum load current in a 25 °C ambient temperature environment.
Fig. 6 shows the MTBF with respect to temperature, and output
load. The MTBF decreases exponentially with temperature. Higher
output loads raise the component junction temperatures and decrease
the reliability. In essence, a high efficiency design using good
thermal management maximizes the reliability by reducing junction
and case temperatures.
T+273
398
T+273
273
1
S lp
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