参数资料
型号: PM75CLB120
厂商: Mitsubishi Electric Corporation
英文描述: FLAT-BASE TYPE INSULATED PACKAGE
中文描述: 平性基地型绝缘包装
文件页数: 5/6页
文件大小: 94K
代理商: PM75CLB120
MITSUBISHI <INTELLIGENT POWER MODULES>
PM75CLB120
FLAT-BASE TYPE
INSULATED PACKAGE
Oct. 2003
PRECAUTIONS FOR TESTING
1. Before appling any control supply voltage (V
D
), the input terminals should be pulled up by resistores, etc. to their corre-
sponding supply voltage and each input signal should be kept off state.
After this, the specified ON and OFF level setting for each input signal should be done.
2. When performing
SC
tests, the turn-off surge voltage spike at the corresponding protection operation should not be al-
lowed to rise above V
CES
rating of the device.
(These test should not be done by using a curve tracer or its equivalent.)
10%
90%
trr
Irr
tr
td (on)
tc (on)
tc (off)
td (off)
V
CIN
Ic
V
CE
10%
10%
10%
90%
tf
(ton= td (on) + tr)
(toff= td (off) + tf)
P, (U,V,W)
U,V,W, (N)
U,V,W, (N)
V
D
(all)
Fig. 1 V
CE(sat)
Test
IN
Fo
Fo
Fo
IN
Fo
V
D
(all)
Fig. 2 V
EC
Test
V
CIN
(0V)
Ic
V
V
P, (U,V,W)
V
CIN
(15V)
Ic
P
N
N
C
S
C
S
U,V,W
Vcc
Vcc
Ic
Ic
V
D
(all)
V
D
(all)
P
U,V,W
V
CIN
V
CIN
V
CIN
(
15V
)
V
CIN
(
15V
)
Fo
Fo
Fig. 3 Switching time and SC test circuit
Fig. 4 Switching time test waveform
a) Lower Arm Switching
Signal input
(Upper Arm)
Signal input
(Lower Arm)
Signal input
(Upper Arm)
Signal input
(Lower Arm)
b) Upper Arm Switching
V
CIN
Fig. 7 Dead time measurement point example
Fig. 5 I
CES
Test
Fig. 6 SC test waveform
SC
Short Circuit Current
toff(SC)
V
D
(all)
U,V,W, (N)
P, (U,V,W)
A
Pulse
V
CE
V
CIN
(15V)
Ic
Fo
IN
Fo
0V
1.5V
1.5V
1.5V
t
dead
2V
2V
2V
0V
t
t
t
dead
t
dead
1.5V: Input on threshold voltage Vth(on) typical value, 2V: Input off threshold voltage Vth(off) typical value
IPM
input signal V
CIN
(Upper Arm)
IPM
input signal V
CIN
(Lower Arm)
Constant Current
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